Inventor · disambiguated record
Michio Nakano
Also filed as: NAKANO MICHIO
6 granted patents·2 pending applications·35 citations·filing 1989–2013
81Inventor score
Top patents by PatentIndex Score
8 records- 0184US9188554B2Pattern inspection device and pattern inspection methodHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 17, 2015·6 cites·18 claims
- 0280US8036447B2Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 11, 2011·10 cites·3 claims
- 0355US7421110B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2004·Granted Sep 2, 2008·6 cites·8 claims
- 0453US7889911B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 15, 2011·1 cites·8 claims
- 0544US2006171593A1Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 0643US2008099675A1Inspection apparatus and an inspection methodHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 0742US5043371AFlame-retardant polybutylene terephthalate resin composition and molded article for electrical componentPOLYPLASTICS CO·Filed 1989·Granted Aug 27, 1991·7 cites·5 claims
- 0841US5273810APolybutylene terephthalate molding composition and molded thin-walled articles therefromPOLYPLASTICS CO·Filed 1991·Granted Dec 28, 1993·5 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →