Inventor · disambiguated record
Yoshiyuki Masuo
Also filed as: MASUO YOSHIYUKI
7 granted patents·3 pending applications·171 citations·filing 1996–2007
87Inventor score
Files withADVANTEST CORP10
Top patents by PatentIndex Score
10 records- 0190US6384593B1Semiconductor device testing apparatusADVANTEST CORP·Filed 2000·Granted May 7, 2002·40 cites·10 claims
- 0287US6104183ASemiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted Aug 15, 2000·62 cites·21 claims
- 0385US7919974B2Electronic device test apparatus and method of configuring electronic device test apparatusADVANTEST CORP·Filed 2005·Granted Apr 5, 2011·10 cites·7 claims
- 0479US6856128B2Semiconductor device testing apparatus and a test tray for use in the testing apparatusADVANTEST CORP·Filed 2001·Granted Feb 15, 2005·19 cites·87 claims
- 0560US6384360B1IC pickup, IC carrier and IC testing apparatus using the sameADVANTEST CORP·Filed 1999·Granted May 7, 2002·24 cites·15 claims
- 0650US6459259B1Tester for semiconductor devices and test tray used for the sameADVANTEST CORP·Filed 1998·Granted Oct 1, 2002·13 cites·86 claims
- 0744US2009189631A1Movement apparatus and electronic device test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0839US2009027060A1Adapter and interface and electronic device test apparatus provided with adapterADVANTEST CORP·Filed 2006·Application pending·0 cites
- 0938USD442568SIC module insertADVANTEST CORP·Filed 2000·Granted May 22, 2001·3 cites·1 claims
- 1037US2008074118A1Pick-And-Place Mechanism Of Electronic Device, Electronic Device Handling Apparatus And Suction Method Of Electronic DeviceADVANTEST CORP·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →