Inventor · disambiguated record

Brynne K. Chisholm

Also filed as: CHISHOLM BRYNNE K

3 granted patents·70 citations·filing 1998–2000

74Inventor score

Technology areasH10P

Files withLSI LOGIC CORP3

Top patents by PatentIndex Score

3 records

0175US6258205B1Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst materialLSI LOGIC CORP·Filed 2000·Granted Jul 10, 2001·17 cites·8 claims
0265US6080670AMethod of detecting a polishing endpoint layer of a semiconductor wafer which includes a non-reactive reporting specieLSI LOGIC CORP·Filed 1998·Granted Jun 27, 2000·31 cites·20 claims
0359US6071818AEndpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst materialLSI LOGIC CORP·Filed 1998·Granted Jun 6, 2000·22 cites·9 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →