Inventor · disambiguated record
Tadayoshi Hosaka
Also filed as: HOSAKA TADAYOSHI
7 granted patents·1 pending application·2 citations·filing 2014–2023
77Inventor score
Technology areasH10P
Files withTOKYO ELECTRON LTD8
Top patents by PatentIndex Score
8 records- 0186US12117485B2Wafer inspection systemTOKYO ELECTRON LTD·Filed 2023·Granted Oct 15, 2024·0 cites·1 claims
- 0284US11762012B2Wafer inspection systemTOKYO ELECTRON LTD·Filed 2022·Granted Sep 19, 2023·0 cites·2 claims
- 0380US9671459B2Maintenance carriage for wafer inspection apparatus and maintenance method for wafer inspection apparatusTOKYO ELECTRON LTD·Filed 2014·Granted Jun 6, 2017·2 cites·5 claims
- 0476US11567123B2Wafer inspection systemTOKYO ELECTRON LTD·Filed 2021·Granted Jan 31, 2023·0 cites·3 claims
- 0574US11061071B2Wafer inspection system, wafer inspection apparatus and proberTOKYO ELECTRON LTD·Filed 2020·Granted Jul 13, 2021·0 cites·5 claims
- 0674US10976364B2Test head and wafer inspection apparatusTOKYO ELECTRON LTD·Filed 2020·Granted Apr 13, 2021·0 cites·6 claims
- 0767US2020064400A1Wafer inspection system, wafer inspection apparatus and proberTOKYO ELECTRON LTD·Filed 2019·Application pending·0 cites
- 0863US10753972B2Wafer inspection system, wafer inspection apparatus and proberTOKYO ELECTRON LTD·Filed 2017·Granted Aug 25, 2020·0 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →