Inventor · disambiguated record
Shoji Kitamura
Also filed as: KITAMURA SHOJI
20 granted patents·2 pending applications·189 citations·filing 1993–2021
93Inventor score
Top patents by PatentIndex Score
22 records- 0182US9337282B2Semiconductor device with point defect region doped with transition metalFUJI ELECTRIC CO LTD·Filed 2013·Granted May 10, 2016·4 cites·8 claims
- 0266US5614735ASemiconductor laser deviceFUJI ELECTRIC CO LTD·Filed 1995·Granted Mar 25, 1997·43 cites·20 claims
- 0365US10700167B2Semiconductor device having an ohmic electrode including a nickel silicide layerFUJI ELECTRIC CO LTD·Filed 2017·Granted Jun 30, 2020·1 cites·5 claims
- 0465US5825794ASemiconductor laser deviceFUJI ELECTRIC CO LTD·Filed 1996·Granted Oct 20, 1998·38 cites·5 claims
- 0564US5485479ASemiconductor laser device encapsulated in a transparent resin layerFUJI ELECTRIC CO LTD·Filed 1994·Granted Jan 16, 1996·34 cites·1 claims
- 0663US11728377B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Aug 15, 2023·0 cites·18 claims
- 0759US5907571ASemiconductor laser device and method for manufacturing the sameFUJI ELECTRIC CO LTD·Filed 1997·Granted May 25, 1999·29 cites·10 claims
- 0858US11087986B2Semiconductor device manufacturing method and semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2020·Granted Aug 10, 2021·0 cites·7 claims
- 0958US9222970B2Fault position analysis method and fault position analysis device for semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2012·Granted Dec 29, 2015·1 cites·16 claims
- 1056US10727304B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2019·Granted Jul 28, 2020·0 cites·12 claims
- 1154US6707131B2Semiconductor device and manufacturing method for the sameFUJI ELECTRIC CO LTD·Filed 2002·Granted Mar 16, 2004·6 cites·9 claims
- 1252US10622212B2Semiconductor device manufacturing method and semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted Apr 14, 2020·0 cites·13 claims
- 1352US9680034B2Manufacturing method for semiconductor device with point defect region doped with transition metalFUJI ELECTRIC CO LTD·Filed 2016·Granted Jun 13, 2017·0 cites·14 claims
- 1450US11257900B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Feb 22, 2022·0 cites·18 claims
- 1550US10374043B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Aug 6, 2019·0 cites·28 claims
- 1650US5590144ASemiconductor laser deviceFUJI ELECTRIC CO LTD·Filed 1994·Granted Dec 31, 1996·15 cites·9 claims
- 1745US2016254148A1Silicon carbide semiconductor device and manufacturing method for sameFUJI ELECTRIC CO LTD·Filed 2014·Application pending·0 cites
- 1843US10396162B2Silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Aug 27, 2019·0 cites·19 claims
- 1943US5444726ASemiconductor laser deviceFUJI ELECTRIC CO LTD·Filed 1993·Granted Aug 22, 1995·13 cites·12 claims
- 2036US2016307993A1Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Application pending·0 cites
- 2134US5488623AMold-type semiconductor laser device with reduced light-emitting point displacement during operationFUJI ELECTRIC CO LTD·Filed 1994·Granted Jan 30, 1996·5 cites·1 claims
- 2228US9680033B2Semiconductor device and manufacturing method thereofKITAMURA CORP·Filed 2011·Granted Jun 13, 2017·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →