Inventor · disambiguated record
Hui-Chong Shin
Also filed as: SHIN HUI-CHONG
7 granted patents·3 pending applications·38 citations·filing 2003–2019
82Inventor score
Top patents by PatentIndex Score
10 records- 0183US7519873B2Methods and apparatus for interfacing between test system and memorySAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 14, 2009·13 cites·25 claims
- 0279US9520160B2Printed circuit board and memory module including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Dec 13, 2016·8 cites·20 claims
- 0363US10684979B2Memory system for supporting internal DQ termination of data bufferSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 16, 2020·0 cites·20 claims
- 0463US7814379B2Memory module packaging test systemSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 12, 2010·4 cites·18 claims
- 0561US7606110B2Memory module, memory unit, and hub with non-periodic clock and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 20, 2009·5 cites·20 claims
- 0657US10496584B2Memory system for supporting internal DQ termination of data bufferSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 3, 2019·0 cites·20 claims
- 0746US6883061B2Electronic system and refresh methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Apr 19, 2005·8 cites·12 claims
- 0844US2005289287A1Method and apparatus for interfacing between test system and embedded memory on test mode setting operationSHIN SEUNG-MAN·Filed 2005·Application pending·0 cites
- 0932US2007030814A1Memory module and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1032US2006064611A1Method of testing memory module and memory moduleSHIN SEUNG-MAN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →