Inventor · disambiguated record
Hiroaki Yamoto
Also filed as: YAMOTO HIROAKI
19 granted patents·4 pending applications·966 citations·filing 1996–2006
96Inventor score
Files withADVANTEST CORP19
Top patents by PatentIndex Score
23 records- 0197US6249893B1Method and structure for testing embedded cores based system-on-a-chipADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·199 cites·17 claims
- 0295US6678645B1Method and apparatus for SoC design validationADVANTEST CORP·Filed 1999·Granted Jan 13, 2004·276 cites·33 claims
- 0393US6651204B1Modular architecture for memory testing on event based test systemADVANTEST CORP·Filed 2000·Granted Nov 18, 2003·64 cites·13 claims
- 0486US6532561B1Event based semiconductor test systemADVANTEST CORP·Filed 1999·Granted Mar 11, 2003·62 cites·12 claims
- 0579US6678643B1Event based semiconductor test systemADVANTEST CORP·Filed 1999·Granted Jan 13, 2004·55 cites·8 claims
- 0679US6631340B2Application specific event based semiconductor memory test systemADVANTEST CORP·Filed 2001·Granted Oct 7, 2003·27 cites·14 claims
- 0776US7089517B2Method for design validation of complex ICADVANTEST CORP·Filed 2001·Granted Aug 8, 2006·23 cites·19 claims
- 0874US6061283ASemiconductor integrated circuit evaluation systemADVANTEST CORP·Filed 1998·Granted May 9, 2000·37 cites·9 claims
- 0972US7089135B2Event based IC test systemADVANTEST CORP·Filed 2002·Granted Aug 8, 2006·15 cites·17 claims
- 1071US7178115B2Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturingADVANTEST CORP·Filed 2003·Granted Feb 13, 2007·15 cites·18 claims
- 1168US6370675B1Semiconductor integrated circuit design and evaluation system using cycle base timingADVANTEST CORP·Filed 1998·Granted Apr 9, 2002·32 cites·10 claims
- 1264US6249889B1Method and structure for testing embedded memoriesADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·44 cites·7 claims
- 1363US7596730B2Test method, test system and assist boardADVANTEST CORP·Filed 2006·Granted Sep 29, 2009·4 cites·22 claims
- 1460US6249892B1Circuit structure for testing microprocessors and test method thereofADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·37 cites·16 claims
- 1560US5951704ATest system emulatorADVANTEST CORP·Filed 1997·Granted Sep 14, 1999·40 cites·3 claims
- 1657US6944808B2Method of evaluating core based system-on-a-chipADVANTEST CORP·Filed 2002·Granted Sep 13, 2005·5 cites·15 claims
- 1746US6249891B1High speed test pattern evaluation apparatusADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·18 cites·9 claims
- 1842US6791316B2High speed semiconductor test system using radially arranged pin cardsADVANTEST CORP·Filed 2002·Granted Sep 14, 2004·1 cites·7 claims
- 1939US5828985ASemiconductor test systemADVANTEST CORP·Filed 1996·Granted Oct 27, 1998·12 cites·3 claims
- 2039US2004019550A1Intangible property enumerating method and systemFiled 2002·Application pending·0 cites
- 2137US2003217341A1Architecture and design of universal IC test systemFiled 2002·Application pending·0 cites
- 2235US2002173942A1Method and apparatus for design validation of complex IC without using logic simulationFiled 2002·Application pending·0 cites
- 2334US2003093737A1Event based test system having improved semiconductor characterization mapFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →