Inventor · disambiguated record
Pang-Shiu Chen
Also filed as: CHEN PANG-SHIU
9 granted patents·3 pending applications·440 citations·filing 2003–2015
86Inventor score
Top patents by PatentIndex Score
12 records- 0197US7202512B2Construction of thin strain-relaxed SiGe layers and method for fabricating the sameIND TECH RES INST·Filed 2004·Granted Apr 10, 2007·417 cites·13 claims
- 0284US8817521B2Control method for memory cellCHEN YU-SHENG·Filed 2012·Granted Aug 26, 2014·12 cites·31 claims
- 0382US9142776B2Resistive random access memory and method for fabricating the sameIND TECH RES INST·Filed 2012·Granted Sep 22, 2015·3 cites·56 claims
- 0471US9373789B2Resistive random access memory and method for fabricating the sameIND TECH RES INST·Filed 2014·Granted Jun 21, 2016·1 cites·43 claims
- 0562US7498224B2Strained silicon forming method with reduction of threading dislocation densityIND TECH RES INST·Filed 2006·Granted Mar 3, 2009·1 cites·6 claims
- 0650US2015280122A1Resistive random access memory and method for fabricating the sameIND TECH RES INST·Filed 2015·Application pending·0 cites
- 0748US7341929B2Method to fabricate patterned strain-relaxed SiGe epitaxial with threading dislocation density controlIND TECH RES INST·Filed 2004·Granted Mar 11, 2008·4 cites·16 claims
- 0847US8223528B2Control method for memory cellCHEN YU-SHENG·Filed 2009·Granted Jul 17, 2012·2 cites·28 claims
- 0943US7102153B2Strained silicon forming method with reduction of threading dislocation densityIND TECH RES INST·Filed 2004·Granted Sep 5, 2006·0 cites·7 claims
- 1037US6916674B2Method for fabricating multiple thickness insulator layersIND TECH RES INST·Filed 2003·Granted Jul 12, 2005·0 cites·16 claims
- 1137US2005153491A1Process of forming low-strain(relaxed) silicon geranium crystal layerFiled 2004·Application pending·0 cites
- 1232US2004087097A1Method of ultra thin base fabrication for Si/SiGe hetro bipolar transisterIND TECH RES INST·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →