Inventor · disambiguated record
Boris Kesil
Also filed as: KESIL BORIS
14 granted patents·12 pending applications·295 citations·filing 2001–2018
93Inventor score
Top patents by PatentIndex Score
26 records- 0193US8547110B2Impedance sensing systems and methods for use in measuring constituents in solid and fluid objectsKESIL BORIS·Filed 2010·Granted Oct 1, 2013·29 cites·45 claims
- 0291US6989675B2Method and apparatus for precision measurement of film thicknessMULTIMETRIXS LLC·Filed 2003·Granted Jan 24, 2006·59 cites·32 claims
- 0390US9911640B2Universal gripping and suction chuckKESIL BORIS·Filed 2015·Granted Mar 6, 2018·8 cites·19 claims
- 0489US7140655B2Precision soft-touch gripping mechanism for flat objectsMULTIMETRIXS LLC·Filed 2001·Granted Nov 28, 2006·59 cites·7 claims
- 0587US9505128B1Method of teaching robotic station for processing objectsKESIL BORIS·Filed 2015·Granted Nov 29, 2016·12 cites·16 claims
- 0686US10099384B1Industrial wedge-type gripper mechanismKESIL BORIS·Filed 2017·Granted Oct 16, 2018·7 cites·15 claims
- 0784US10418263B2Overhead transportation system for transporting objects between multiple work stationsKESIL BORIS·Filed 2018·Granted Sep 17, 2019·4 cites·20 claims
- 0881US6842025B2Apparatus and method for multiple identical continuous records of characteristics on the surface of an object after selected stages of manufacture and treatmentMULTIMETRIXS L L C·Filed 2003·Granted Jan 11, 2005·26 cites·46 claims
- 0980US6593738B2Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensorsFiled 2001·Granted Jul 15, 2003·28 cites·14 claims
- 1077US6815958B2Method and apparatus for measuring thickness of thin films with improved accuracyMULTIMETRIXS LLC·Filed 2003·Granted Nov 9, 2004·18 cites·19 claims
- 1175US6891380B2System and method for measuring characteristics of materials with the use of a composite sensorMULTIMETRIXS LLC·Filed 2003·Granted May 10, 2005·21 cites·13 claims
- 1275US6801044B2Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objectsFiled 2003·Granted Oct 5, 2004·17 cites·17 claims
- 1355US2009208669A1Apparatus and method for application of a thin barrier layer onto inner surfaces of wafer containersMULTIMETRIXS LLC·Filed 2008·Application pending·0 cites
- 1449US6831287B2Method and apparatus for preventing transfer of an object having wrong dimensions or orientationMULTIMETRIXS LLC·Filed 2001·Granted Dec 14, 2004·3 cites·2 claims
- 1546US2009241998A1Apparatus for foam-assisted wafer cleaning with use of universal fluid supply unitMULTIMETRIXS LLC·Filed 2008·Application pending·0 cites
- 1645US2009217950A1Method and apparatus for foam-assisted wafer cleaningMULTIMETRIXS LLC·Filed 2008·Application pending·0 cites
- 1745US2005281661A1End effector with force controlling mechanismKESIL BORIS·Filed 2005·Application pending·0 cites
- 1845US2009200250A1Cleanliness-improved wafer containerMULTIMETRIXS LLC·Filed 2008·Application pending·0 cites
- 1941US2009121586A1Apparatus for transforming inverse piezoelectric effect into rotary motion and method of manufacturing aforementioned apparatusMULTIMETRIXS LLC·Filed 2007·Application pending·0 cites
- 2040US2007018469A1Contamination-free edge gripping mechanism with withdrawable pads and method for loading/unloading and transferring flat objectsMULTIMETRIXS LLC·Filed 2005·Application pending·0 cites
- 2140US2004102858A1Soft-touch gripping mechanism for flat objectsFiled 2003·Application pending·0 cites
- 2239US2006157998A1Contamination-free edge gripping mechanism and method for loading/unloading and transferring flat objectsGERSHENZON ELIK·Filed 2005·Application pending·0 cites
- 2335US2016346923A1Robotic station with self-teaching functionsKESIL BORIS·Filed 2015·Application pending·0 cites
- 2434US6900451B2Mapping sensor system for detecting positions of flat objectsMULTIMEXTRIXS LLC·Filed 2001·Granted May 31, 2005·4 cites·14 claims
- 2534US2004227524A1Method and system for measuring thickness of thin films with automatic stabilization of measurement accuracyFiled 2003·Application pending·0 cites
- 2633US2016332301A1Method of handling and transporting flat objects between a plurality of flat object pocessing units at robotic stationKESIL BORIS·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Boris Kesil files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →