Inventor · disambiguated record
Kiyoshi Nikawa
Also filed as: NIKAWA KIYOSHI
23 granted patents·2 pending applications·810 citations·filing 1985–2008
96Inventor score
Top patents by PatentIndex Score
25 records- 0196US6028435ASemiconductor device evaluation system using optical fiberNEC CORP·Filed 1997·Granted Feb 22, 2000·159 cites·51 claims
- 0294US6160407AInspection method and wiring current observation method for semiconductor device and apparatus of the sameNEC CORP·Filed 1998·Granted Dec 12, 2000·107 cites·6 claims
- 0392US6444895B1Device and method for nondestructive inspection on semiconductor deviceNEC CORP·Filed 1999·Granted Sep 3, 2002·74 cites·17 claims
- 0490US6320396B1Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor deviceNEC CORP·Filed 1997·Granted Nov 20, 2001·109 cites·8 claims
- 0588US5804980AMethod and system for testing an interconnection in a semiconductor integrated circuitNEC CORP·Filed 1995·Granted Sep 8, 1998·74 cites·18 claims
- 0687US7825673B2Failure analysis method and failure analysis apparatusNEC ELECTRONICS CORP·Filed 2008·Granted Nov 2, 2010·11 cites·19 claims
- 0787US6066956AInspection method and wiring current observation method for semiconductor deviceNEC CORP·Filed 1996·Granted May 23, 2000·55 cites·6 claims
- 0887US5422498AApparatus for diagnosing interconnections of semiconductor integrated circuitsNEC CORP·Filed 1994·Granted Jun 6, 1995·70 cites·22 claims
- 0980US5815002AMethod and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairsNEC CORP·Filed 1996·Granted Sep 29, 1998·45 cites·2 claims
- 1074US6593156B2Non-destructive inspection methodNEC CORP·Filed 2001·Granted Jul 15, 2003·17 cites·23 claims
- 1172US5548211ADynamic fault imaging system using electron beam and method of analyzing faultNEC CORP·Filed 1995·Granted Aug 20, 1996·41 cites·12 claims
- 1266US7173447B2Method and apparatus for diagnosing fault in semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Feb 6, 2007·6 cites·15 claims
- 1356US6759259B2Device and method for nondestructive inspection on semiconductor deviceNEC ELECTRONICS CORP·Filed 2002·Granted Jul 6, 2004·5 cites·26 claims
- 1455US8090191B2Method and apparatus for inspection and fault analysisNIKAWA KIYOSHI·Filed 2008·Granted Jan 3, 2012·1 cites·12 claims
- 1553US6610918B2Device and method for nondestructive inspection on semiconductor deviceNEC ELECTRONICS CORP·Filed 2002·Granted Aug 26, 2003·4 cites·19 claims
- 1651US7495449B2Non-destructive testing apparatus and non-destructive testing methodNEC ELECTRONICS CORP·Filed 2006·Granted Feb 24, 2009·1 cites·14 claims
- 1749US5521516ASemiconductor integrated circuit fault analyzing apparatus and method thereforNEC CORP·Filed 1994·Granted May 28, 1996·14 cites·20 claims
- 1845US7484883B2Non-destructive testing apparatus and non-destructive testing methodNEC ELECTRONICS CORP·Filed 2006·Granted Feb 3, 2009·0 cites·10 claims
- 1939US4734754ASemiconductor device having improved structure of multi-wiring layersNEC CORP·Filed 1985·Granted Mar 29, 1988·9 cites·7 claims
- 2039US2007103151A1Inspection method and device for semiconductor equipmentNEC ELECTRONICS CORP·Filed 2006·Application pending·0 cites
- 2137US2005140367A1Nondestructive and noncontact analysis systemNEC ELECTRONICS CORP·Filed 2004·Application pending·0 cites
- 2235US6137304AMethod and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairsNEC CORP·Filed 1999·Granted Oct 24, 2000·5 cites·3 claims
- 2332US6072327AMethod and device of testing semiconductor integrated circuit chip capable of preventing electron-hole pairsNEC CORP·Filed 1998·Granted Jun 6, 2000·2 cites·3 claims
- 2430US7250758B2Inspection method and apparatus using scanning laser SQUID microscopeNEC ELECTRONICS CORP·Filed 2006·Granted Jul 31, 2007·0 cites·16 claims
- 2530US6084423AMethod and device of testing a semiconductor integrated circuit chip in which a voltage across the semiconductor integrated circuit chip is detected while an ultrasonic wave beam is projected thereonNEC CORP·Filed 1999·Granted Jul 4, 2000·1 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →