Inventor · disambiguated record
Akio Wakejima
Also filed as: WAKEJIMA AKIO
9 granted patents·4 pending applications·130 citations·filing 2001–2018
87Inventor score
Top patents by PatentIndex Score
13 records- 0195US7800131B2Field effect transistorNEC CORP·Filed 2006·Granted Sep 21, 2010·48 cites·17 claims
- 0294US7863648B2Field effect transistorNEC CORP·Filed 2006·Granted Jan 4, 2011·38 cites·15 claims
- 0393US8853666B2Field effect transistor, and multilayered epitaxial film for use in preparation of field effect transistorINOUE TAKASHI·Filed 2006·Granted Oct 7, 2014·26 cites·21 claims
- 0483US9954087B2Field effect transistor, and multilayered epitaxial film for use in preparation of field effect transistorRENESAS ELECTRONICS CORP·Filed 2014·Granted Apr 24, 2018·5 cites·6 claims
- 0579US8198652B2Field effect transistor with reduced gate leakage currentANDO YUJI·Filed 2007·Granted Jun 12, 2012·7 cites·9 claims
- 0667US8466495B2Field effect transistor with reduced gate leakage currentANDO YUJI·Filed 2012·Granted Jun 18, 2013·2 cites·8 claims
- 0767US8063484B2Semiconductor device and heat sink with 3-dimensional thermal conductivityKURODA NAOTAKA·Filed 2007·Granted Nov 22, 2011·4 cites·9 claims
- 0854US2018233590A1Field effect transistor and multilayered epitaxial film for use in preparation of field effect transistorRENESAS ELECTRONICS CORP·Filed 2018·Application pending·0 cites
- 0944US8476756B2Semiconductor device and heat sink with 3-dimensional thermal conductivityKURODA NAOTAKA·Filed 2011·Granted Jul 2, 2013·0 cites·11 claims
- 1040US2009173968A1Field Effect TransistorNEC CORP·Filed 2006·Application pending·0 cites
- 1131US2002171096A1Schottky gate field effect transistor with high output characteristicNEC CORP·Filed 2002·Application pending·0 cites
- 1228US8476980B2High frequency power amplifierWAKEJIMA AKIO·Filed 2010·Granted Jul 2, 2013·0 cites·9 claims
- 1328US2002025664A1Process for production of gate electrode and gate electrode structureNEC CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →