Inventor · disambiguated record
Avi Ravid
Also filed as: RAVID AVI
5 granted patents·1 pending application·166 citations·filing 1999–2002
83Inventor score
Files withNOVA MEASURING INSTR LTD6
Top patents by PatentIndex Score
6 records- 0192US6556947B1Optical measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 2000·Granted Apr 29, 2003·79 cites·24 claims
- 0278US6292265B1Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objectsNOVA MEASURING INSTR LTD·Filed 1999·Granted Sep 18, 2001·56 cites·13 claims
- 0369US6801326B2Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objectsNOVA MEASURING INSTR LTD·Filed 2001·Granted Oct 5, 2004·13 cites·29 claims
- 0466US6654108B2Test structure for metal CMP process controlNOVA MEASURING INSTR LTD·Filed 2001·Granted Nov 25, 2003·12 cites·23 claims
- 0565US6885446B2Method and system for monitoring a process of material removal from the surface of a patterned structureNOVA MEASURING INSTR LTD·Filed 2002·Granted Apr 26, 2005·6 cites·43 claims
- 0634US2001015811A1Test structure for metal CMP process controlNOVA MEASURING INSTR LTD·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →