Inventor · disambiguated record
David C. Brady
Also filed as: BRADY DAVID C · BRADY DAVID CHARLES
10 granted patents·1 pending application·869 citations·filing 1996–2003
92Inventor score
Top patents by PatentIndex Score
11 records- 0197US6246095B1System and method for forming a uniform thin gate oxide layerAGERE SYST GUARDIAN CORP·Filed 1998·Granted Jun 12, 2001·250 cites·13 claims
- 0297US6025280AUse of SiD4 for deposition of ultra thin and controllable oxidesLUCENT TECHNOLOGIES INC·Filed 1997·Granted Feb 15, 2000·282 cites·14 claims
- 0397US5940736AMethod for forming a high quality ultrathin gate oxide layerLUCENT TECHNOLOGIES INC·Filed 1997·Granted Aug 17, 1999·264 cites·13 claims
- 0472US6670242B1Method for making an integrated circuit device including a graded, grown, high quality gate oxide layer and a nitride layerAGERE SYSTEMS INC·Filed 2000·Granted Dec 30, 2003·16 cites·20 claims
- 0569US6548422B1Method and structure for oxide/silicon nitride interface substructure improvementsAGERE SYSTEMS INC·Filed 2001·Granted Apr 15, 2003·11 cites·13 claims
- 0659US6281138B1System and method for forming a uniform thin gate oxide layerAGERE SYST GUARDIAN CORP·Filed 1999·Granted Aug 28, 2001·20 cites·6 claims
- 0752US6090686ALocos isolation process using a layered pad nitride and dry field oxidation stack and semiconductor device employing the sameLUCENT TECHNOLOGIES INC·Filed 1997·Granted Jul 18, 2000·14 cites·11 claims
- 0851US6800255B2System and method for the abatement of toxic constituents of effluent gasesAGERE SYSTEMS INC·Filed 2002·Granted Oct 5, 2004·5 cites·6 claims
- 0941US2003186499A1Structure for oxide/silicon nitride interface substructure improvementsAGERE SYSTEMS INC·Filed 2003·Application pending·0 cites
- 1036US5966627AIn-situ doped silicon layersLUCENT TECHNOLOGIES INC·Filed 1996·Granted Oct 12, 1999·5 cites·5 claims
- 1132US6380606B1Locos isolation process using a layered pad nitride and dry field oxidation stack and semiconductor device employing the sameAGERE SYST GUARDIAN CORP·Filed 1998·Granted Apr 30, 2002·2 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →