Inventor · disambiguated record
Erik Cho Houge
Also filed as: HOUGE ERIK C · HOUGE ERIK CHO
25 granted patents·3 pending applications·264 citations·filing 1999–2003
96Inventor score
Top patents by PatentIndex Score
28 records- 0191US6641746B2Control of semiconductor processingAGERE SYSTEMS INC·Filed 2001·Granted Nov 4, 2003·48 cites·12 claims
- 0287US6651226B2Process control using three dimensional reconstruction metrologyAGERE SYSTEMS INC·Filed 2001·Granted Nov 18, 2003·29 cites·20 claims
- 0380US6569690B1Monitoring system for determining progress in a fabrication activityAGERE SYST GUARDIAN CORP·Filed 2000·Granted May 27, 2003·21 cites·9 claims
- 0477US6714892B2Three dimensional reconstruction metrologyAGERE SYSTEMS INC·Filed 2001·Granted Mar 30, 2004·15 cites·20 claims
- 0576US6250143B1Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-sectionAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 26, 2001·50 cites·12 claims
- 0674US6625250B2Optical structures and methods for x-ray applicationsAGERE SYSTEMS INC·Filed 2000·Granted Sep 23, 2003·14 cites·15 claims
- 0770US6606371B2X-ray systemAGERE SYSTEMS INC·Filed 2000·Granted Aug 12, 2003·11 cites·10 claims
- 0869US6750447B2Calibration standard for high resolution electron microscopyAGERE SYSTEMS INC·Filed 2002·Granted Jun 15, 2004·8 cites·12 claims
- 0968US6727720B2Probe having a microstyletAGERE SYSTEMS INC·Filed 2001·Granted Apr 27, 2004·14 cites·11 claims
- 1064US7972440B2Monitoring and control of a fabrication processAGERE SYSTEMS INC·Filed 2003·Granted Jul 5, 2011·10 cites·21 claims
- 1164US6577970B2Method of determining a crystallographic quality of a material located on a substrateAGERE SYSTEMS INC·Filed 2001·Granted Jun 10, 2003·5 cites·20 claims
- 1262US6870950B2Method for detecting defects in a material and a system for accomplishing the sameAGERE SYSTEMS INC·Filed 2001·Granted Mar 22, 2005·7 cites·25 claims
- 1358US6899596B2Chemical mechanical polishing of dual orientation polycrystalline materialsAGERE SYSTEMS INC·Filed 2002·Granted May 31, 2005·3 cites·26 claims
- 1450US6695572B2Method and apparatus for minimizing semiconductor wafer contaminationAGERE SYSTEMS INC·Filed 2001·Granted Feb 24, 2004·4 cites·1 claims
- 1550US6633032B2Mass spectrometer particle counterAGERE SYSTEMS INC·Filed 2000·Granted Oct 14, 2003·2 cites·21 claims
- 1648US7342225B2Crystallographic metrology and process controlAGERE SYSTEMS INC·Filed 2003·Granted Mar 11, 2008·3 cites·52 claims
- 1748US6405584B1Probe for scanning probe microscopy and related methodsAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 18, 2002·14 cites·43 claims
- 1840US6713409B2Semiconductor manufacturing using modular substratesAGERE SYSTEMS INC·Filed 2002·Granted Mar 30, 2004·0 cites·14 claims
- 1939US6534851B1Modular semiconductor substratesAGERE SYSTEMS INC·Filed 2000·Granted Mar 18, 2003·0 cites·27 claims
- 2038US6708574B2Abnormal photoresist line/space profile detection through signal processing of metrology waveformAGERE SYSTEMS INC·Filed 2002·Granted Mar 23, 2004·0 cites·11 claims
- 2138US6627885B1Method of focused ion beam pattern transfer using a smart dynamic templateAGERE SYSTEMS INC·Filed 2000·Granted Sep 30, 2003·0 cites·11 claims
- 2236US2002150509A1Laboratory specimen sampler with integrated specimen mountFiled 2001·Application pending·0 cites
- 2335US6825467B2Apparatus for scanning a crystalline sample and associated methodsAGERE SYSTEMS INC·Filed 2002·Granted Nov 30, 2004·0 cites·17 claims
- 2435US6425189B1Probe tip locator having improved marker arrangement for reduced bit encoding errorAGERE SYST GUARDIAN CORP·Filed 2000·Granted Jul 30, 2002·0 cites·21 claims
- 2535US6265235B1Method of sectioning of photoresist for shape evaluationLUCENT TECHNOLOGIES INC·Filed 1999·Granted Jul 24, 2001·4 cites·21 claims
- 2634US6783426B2Method and apparatus for detection of chemical mechanical planarization endpoint and device planarityAGERE SYSTEMS INC·Filed 2002·Granted Aug 31, 2004·2 cites·28 claims
- 2734US2003184769A1Patterned implant metrologyFiled 2002·Application pending·0 cites
- 2833US2002062572A1Method of determining the shape of a probe for a stylus profilometerFiled 2000·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Erik Cho Houge files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →