Inventor · disambiguated record
Hiroyasu Shichi
Also filed as: SHICHI HIROYASU
78 granted patents·9 pending applications·1,381 citations·filing 1985–2021
99Inventor score
Files withHITACHI HIGH TECH CORP37HITACHI LTD32SHICHI HIROYASU11HITACHI HIGH TECH SCIENCE CORP2TOKUDA MITSUO2
Top patents by PatentIndex Score
87 records- 0199US8779400B2Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sampleHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 15, 2014·91 cites·12 claims
- 0299US6664552B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2001·Granted Dec 16, 2003·139 cites·2 claims
- 0397US6781125B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2001·Granted Aug 24, 2004·114 cites·14 claims
- 0496US7326942B2Ion beam system and machining methodHITACHI HIGH TECH CORP·Filed 2005·Granted Feb 5, 2008·24 cites·16 claims
- 0596US7205560B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·32 cites·27 claims
- 0696US7205554B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·34 cites·5 claims
- 0796US6717156B2Beam as well as method and equipment for specimen fabricationHITACHI LTD·Filed 2002·Granted Apr 6, 2004·109 cites·19 claims
- 0896US5481109ASurface analysis method and apparatus for carrying out the sameHITACHI LTD·Filed 1993·Granted Jan 2, 1996·121 cites·80 claims
- 0995US7700931B2Ion beam processing apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 20, 2010·20 cites·9 claims
- 1095US7550750B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Jun 23, 2009·26 cites·32 claims
- 1195US6927391B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2004·Granted Aug 9, 2005·69 cites·4 claims
- 1295US6858851B2Apparatus for specimen fabrication and method for specimen fabricationHITACHI HIGH TECH CORP·Filed 2003·Granted Feb 22, 2005·57 cites·12 claims
- 1394US8263943B2Ion beam deviceSHICHI HIROYASU·Filed 2010·Granted Sep 11, 2012·16 cites·20 claims
- 1494US8115184B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2008·Granted Feb 14, 2012·20 cites·15 claims
- 1594US7897936B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Mar 1, 2011·15 cites·15 claims
- 1694US7470918B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 30, 2008·22 cites·15 claims
- 1794US7465945B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 16, 2008·20 cites·7 claims
- 1893US8481980B2Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sampleSHICHI HIROYASU·Filed 2008·Granted Jul 9, 2013·17 cites·11 claims
- 1992US7888639B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Feb 15, 2011·14 cites·2 claims
- 2092US6794663B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Sep 21, 2004·33 cites·9 claims
- 2191US7952083B2Ion beam system and machining methodHITACHI HIGH TECH CORP·Filed 2008·Granted May 31, 2011·11 cites·6 claims
- 2291US7368729B2Method, apparatus and system for specimen fabrication by using an ion beamHITACHI HIGH TECH CORP·Filed 2006·Granted May 6, 2008·12 cites·13 claims
- 2390US7268356B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Sep 11, 2007·28 cites·13 claims
- 2489US8222618B2Method and apparatus for processing a microsampleTOKUDA MITSUO·Filed 2011·Granted Jul 17, 2012·9 cites·18 claims
- 2589US7482603B2Apparatus and method for specimen fabricationHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 27, 2009·10 cites·22 claims
- 2689US7453072B2Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment thereforHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 18, 2008·7 cites·9 claims
- 2788US8618520B2Method and apparatus for processing a micro sampleTOKUDA MITSUO·Filed 2012·Granted Dec 31, 2013·7 cites·24 claims
- 2887US4687938AIon sourceHITACHI LTD·Filed 1985·Granted Aug 18, 1987·38 cites·7 claims
- 2986US7095021B2Method, apparatus and system for specimen fabrication by using an ion beamHITACHI HIGH TECH CORP·Filed 2004·Granted Aug 22, 2006·19 cites·17 claims
- 3084US10304653B2Ion milling device, ion source and ion milling methodHITACHI HIGH TECH CORP·Filed 2015·Granted May 28, 2019·3 cites·20 claims
- 3184US7372050B2Method of preventing charging, and apparatus for charged particle beam using the sameHITACHI LTD·Filed 2005·Granted May 13, 2008·5 cites·10 claims
- 3283US5877498AMethod and apparatus for X-ray analysesHITACHI LTD·Filed 1997·Granted Mar 2, 1999·42 cites·20 claims
- 3381US10163602B2Ion beam systemHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Dec 25, 2018·2 cites·15 claims
- 3480US7667212B2Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment thereforHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 23, 2010·2 cites·11 claims
- 3579US8847173B2Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing sameKAWANAMI YOSHIMI·Filed 2011·Granted Sep 30, 2014·5 cites·9 claims
- 3679US8563944B2Ion beam deviceSHICHI HIROYASU·Filed 2012·Granted Oct 22, 2013·3 cites·5 claims
- 3778US8431891B2Dual beam apparatus with tilting sample stageSHICHI HIROYASU·Filed 2010·Granted Apr 30, 2013·3 cites·20 claims
- 3877US8796651B2Method and apparatus for specimen fabricationSHICHI HIROYASU·Filed 2011·Granted Aug 5, 2014·2 cites·12 claims
- 3977US7989782B2Apparatus and method for specimen fabricationHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 2, 2011·3 cites·17 claims
- 4077US5714757ASurface analyzing method and its apparatusHITACHI LTD·Filed 1995·Granted Feb 3, 1998·32 cites·32 claims
- 4176US7242013B2Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment thereforHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 10, 2007·10 cites·9 claims
- 4276US4774433AApparatus for generating metal ionsHITACHI LTD·Filed 1987·Granted Sep 27, 1988·22 cites·2 claims
- 4374US8530865B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2012·Granted Sep 10, 2013·2 cites·13 claims
- 4474US4851673ASecondary ion mass spectrometerHITACHI LTD·Filed 1988·Granted Jul 25, 1989·20 cites·6 claims
- 4571US9640360B2Ion source and ion beam device using sameHITACHI HIGH TECH CORP·Filed 2012·Granted May 2, 2017·2 cites·11 claims
- 4671US6977376B2Method of prevention charging, and apparatus for charged particle beam using the sameHITACHI LTD·Filed 2004·Granted Dec 20, 2005·6 cites·4 claims
- 4770US5012109ACharged particle beam apparatusHITACHI LTD·Filed 1989·Granted Apr 30, 1991·16 cites·5 claims
- 4870US4841143ACharged particle beam apparatusHITACHI LTD·Filed 1988·Granted Jun 20, 1989·15 cites·8 claims
- 4969US6774363B2Method of preventing charging, and apparatus for charged particle beam using the sameHITACHI LTD·Filed 2002·Granted Aug 10, 2004·5 cites·13 claims
- 5069US5594246AMethod and apparatus for x-ray analysesHITACHI LTD·Filed 1995·Granted Jan 14, 1997·21 cites·75 claims
Showing the top 50 of 87 patent records by PatentIndex Score.
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