Inventor · disambiguated record
Tokuo Kure
Also filed as: KURE TOKUO
61 granted patents·3 pending applications·2,844 citations·filing 1982–2013
99Inventor score
Top patents by PatentIndex Score
64 records- 0199US4985114ADry etching by alternately etching and depositingHITACHI LTD·Filed 1989·Granted Jan 15, 1991·601 cites·8 claims
- 0298US5412210AScanning electron microscope and method for production of semiconductor device by using the sameHITACHI LTD·Filed 1993·Granted May 2, 1995·148 cites·70 claims
- 0397US5177576ADynamic random access memory having trench capacitors and vertical transistorsHITACHI LTD·Filed 1991·Granted Jan 5, 1993·174 cites·20 claims
- 0496US5481109ASurface analysis method and apparatus for carrying out the sameHITACHI LTD·Filed 1993·Granted Jan 2, 1996·121 cites·80 claims
- 0594US5196910ASemiconductor memory device with recessed array regionHITACHI LTD·Filed 1991·Granted Mar 23, 1993·108 cites·21 claims
- 0694US4970564ASemiconductor memory device having stacked capacitor cellsHITACHI LTD·Filed 1988·Granted Nov 13, 1990·99 cites·26 claims
- 0793US6114695AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1999·Granted Sep 5, 2000·62 cites·4 claims
- 0893US5188976AManufacturing method of non-volatile semiconductor memory deviceHITACHI LTD·Filed 1991·Granted Feb 23, 1993·120 cites·10 claims
- 0992US4882289AMethod of making a semiconductor memory device with recessed array regionHITACHI LTD·Filed 1988·Granted Nov 21, 1989·85 cites·7 claims
- 1091US5594245AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1995·Granted Jan 14, 1997·71 cites·20 claims
- 1191US5140389ASemiconductor memory device having stacked capacitor cellsHITACHI LTD·Filed 1990·Granted Aug 18, 1992·74 cites·23 claims
- 1291US4529476AGas for selectively etching silicon nitride and process for selectively etching silicon nitride with the gasSHOWA DENKO KK·Filed 1984·Granted Jul 16, 1985·89 cites·13 claims
- 1389US5091761ASemiconductor device having an arrangement of IGFETs and capacitors stacked thereoverHITACHI LTD·Filed 1989·Granted Feb 25, 1992·70 cites·42 claims
- 1488US5969357AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1997·Granted Oct 19, 1999·43 cites·20 claims
- 1587US4937641ASemiconductor memory and method of producing the sameHITACHI LTD·Filed 1987·Granted Jun 26, 1990·67 cites·11 claims
- 1686US5357464ASemiconductor memory having writing and reading transistors, method of fabrication thereof, and method of use thereofHITACHI LTD·Filed 1993·Granted Oct 18, 1994·63 cites·8 claims
- 1783US5877498AMethod and apparatus for X-ray analysesHITACHI LTD·Filed 1997·Granted Mar 2, 1999·42 cites·20 claims
- 1883US5866904AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1997·Granted Feb 2, 1999·42 cites·24 claims
- 1981US4635090ATapered groove IC isolationHITACHI LTD·Filed 1985·Granted Jan 6, 1987·49 cites·23 claims
- 2080US6677244B2Specimen surface processing methodHITACHI LTD·Filed 2002·Granted Jan 13, 2004·18 cites·4 claims
- 2179US5658811AMethod of manufacturing a semiconductor deviceHITACHI LTD·Filed 1995·Granted Aug 19, 1997·45 cites·31 claims
- 2279US5053849ATransistor with overlapping gate/drain and two-layered gate structuresHITACHI LTD·Filed 1990·Granted Oct 1, 1991·51 cites·22 claims
- 2379US4751557ADram with FET stacked over capacitorHITACHI LTD·Filed 1986·Granted Jun 14, 1988·45 cites·11 claims
- 2478US5296729ASemiconductor memory device having static random access memoryHITACHI LTD·Filed 1991·Granted Mar 22, 1994·48 cites·4 claims
- 2575US5352324AEtching method and etching apparatus thereforHITACHI LTD·Filed 1993·Granted Oct 4, 1994·59 cites·16 claims
- 2672US4396460AMethod of forming groove isolation in a semiconductor deviceHITACHI LTD·Filed 1982·Granted Aug 2, 1983·34 cites·9 claims
- 2771US6797566B1Semiconductor integrated circuit device and process for producing the sameRENESAS TECH CORP·Filed 2000·Granted Sep 28, 2004·13 cites·13 claims
- 2871US6767838B1Method and apparatus for treating surface of semiconductorHITACHI LTD·Filed 2000·Granted Jul 27, 2004·11 cites·9 claims
- 2969US5594246AMethod and apparatus for x-ray analysesHITACHI LTD·Filed 1995·Granted Jan 14, 1997·21 cites·75 claims
- 3068US4901128ASemiconductor memoryHITACHI LTD·Filed 1986·Granted Feb 13, 1990·25 cites·21 claims
- 3167US6660647B1Method for processing surface of sampleHITACHI LTD·Filed 1999·Granted Dec 9, 2003·28 cites·14 claims
- 3265US6849191B2Method and apparatus for treating surface of semiconductorHITACHI LTD·Filed 1999·Granted Feb 1, 2005·24 cites·6 claims
- 3362US5357131ASemiconductor memory with trench capacitorHITACHI LTD·Filed 1993·Granted Oct 18, 1994·32 cites·5 claims
- 3460US5200635ASemiconductor device having a low-resistivity planar wiring structureHITACHI LTD·Filed 1991·Granted Apr 6, 1993·20 cites·5 claims
- 3559USRE38296ESemiconductor memory device with recessed array regionHITACHI LTD·Filed 1995·Granted Nov 4, 2003·17 cites·44 claims
- 3658US5237528ASemiconductor memoryHITACHI LTD·Filed 1992·Granted Aug 17, 1993·18 cites·9 claims
- 3757US6355517B1Method for fabricating semiconductor memory with a grooveHITACHI LTD·Filed 1993·Granted Mar 12, 2002·17 cites·28 claims
- 3855US4984048ASemiconductor device with buried side contactHITACHI LTD·Filed 1988·Granted Jan 8, 1991·20 cites·30 claims
- 3953US7105409B2Semiconductor integrated circuit device and process for producing the sameRENESAS TECH CORP·Filed 2004·Granted Sep 12, 2006·4 cites·4 claims
- 4053US5214496ASemiconductor memoryHITACHI LTD·Filed 1989·Granted May 25, 1993·13 cites·42 claims
- 4152US5583358ASemiconductor memory device having stacked capacitorsHITACHI LTD·Filed 1994·Granted Dec 10, 1996·11 cites·12 claims
- 4252US5374576AMethod of fabricating stacked capacitor cell memory devicesHITACHI LTD·Filed 1993·Granted Dec 20, 1994·11 cites·8 claims
- 4351US4812894ASemiconductor deviceHITACHI LTD·Filed 1988·Granted Mar 14, 1989·17 cites·16 claims
- 4450US7259104B2Sample surface processing methodHITACHI LTD·Filed 2003·Granted Aug 21, 2007·2 cites·7 claims
- 4550US5128743ASemiconductor device and method of manufacturing the sameHITACHI LTD·Filed 1986·Granted Jul 7, 1992·13 cites·13 claims
- 4650US4984038ASemiconductor memory and method of producing the sameHITACHI LTD·Filed 1988·Granted Jan 8, 1991·14 cites·6 claims
- 4747US9744569B2Method for cleaning piping and cleaning system for pipingHITACHI LTD·Filed 2013·Granted Aug 29, 2017·0 cites·2 claims
- 4847US4984030AVertical MOSFET DRAMHITACHI LTD·Filed 1988·Granted Jan 8, 1991·13 cites·18 claims
- 4947US2006275986A1Semiconductor intergrated circuit device and process for producing the sameRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 5045US4873203AMethod for formation of insulation film on silicon buried in trenchHITACHI LTD·Filed 1988·Granted Oct 10, 1989·12 cites·20 claims
Showing the top 50 of 64 patent records by PatentIndex Score.
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