Inventor · disambiguated record
Yusuke Kohyama
Also filed as: KOHYAMA YUSUKE
79 granted patents·10 pending applications·1,602 citations·filing 1990–2023
99Inventor score
Files withTOSHIBA KK75TOSHIBA AMERICA ELECTRONIC5SONY SEMICONDUCTOR SOLUTIONS CORP4KOHYAMA YUSUKE2FURUYA SHOGO1
Top patents by PatentIndex Score
89 records- 0194US6222722B1Storage capacitor having undulated lower electrode for a semiconductor deviceTOSHIBA KK·Filed 1999·Granted Apr 24, 2001·104 cites·24 claims
- 0294US5959324ASemiconductor device including an improved terminal structureTOSHIBA KK·Filed 1997·Granted Sep 28, 1999·92 cites·14 claims
- 0393US8138533B2Semiconductor device with an electrode as an alignment mark, and method of manufacturing the sameKOIKE HIDETOSHI·Filed 2009·Granted Mar 20, 2012·29 cites·15 claims
- 0492US8039883B2Solid-state image pickup device and method for manufacturing sameTOSHIBA KK·Filed 2009·Granted Oct 18, 2011·13 cites·8 claims
- 0592US6403444B2Method for forming storage capacitor having undulated lower electrode for a semiconductor deviceTOSHIBA KK·Filed 2001·Granted Jun 11, 2002·59 cites·38 claims
- 0691US6051859ADRAM having a cup-shaped storage node electrode recessed within an insulating layerTOSHIBA KK·Filed 1998·Granted Apr 18, 2000·71 cites·27 claims
- 0790US8310003B2Solid-state imaging device with vertical gate electrode and method of manufacturing the sameKOHYAMA YUSUKE·Filed 2009·Granted Nov 13, 2012·15 cites·8 claims
- 0889US5555520ATrench capacitor cells for a dram having single monocrystalline capacitor electrodeTOSHIBA KK·Filed 1994·Granted Sep 10, 1996·81 cites·17 claims
- 0987US7514752B2Reduction of short-circuiting between contacts at or near a tensile-compressive boundaryTOSHIBA AMERICA ELECTRONIC·Filed 2005·Granted Apr 7, 2009·13 cites·20 claims
- 1087US6720606B1Dynamic semiconductor memory device having a trench capacitorTOSHIBA KK·Filed 2000·Granted Apr 13, 2004·39 cites·12 claims
- 1187US6548844B1Capacitor having a structure capable of restraining deterioration of dielectric film, semiconductor device having the capacitor and method of manufacturing the sameTOSHIBA KK·Filed 2000·Granted Apr 15, 2003·35 cites·35 claims
- 1286US6774439B2Semiconductor device using fuse/anti-fuse systemTOSHIBA KK·Filed 2001·Granted Aug 10, 2004·33 cites·11 claims
- 1386US5142639ASemiconductor memory device having a stacked capacitor cell structureTOSHIBA KK·Filed 1991·Granted Aug 25, 1992·77 cites·17 claims
- 1484US8133753B2Solid-state image pickup device and method for manufacturing sameKOHYAMA YUSUKE·Filed 2011·Granted Mar 13, 2012·3 cites·8 claims
- 1582US7187027B2Stacked capacitor-type semiconductor storage device and manufacturing method thereofTOSHIBA KK·Filed 2006·Granted Mar 6, 2007·7 cites·7 claims
- 1682US5977583ASemiconductor memory device including memory cells having a capacitor on bit line structureTOSHIBA KK·Filed 1996·Granted Nov 2, 1999·35 cites·17 claims
- 1782US5281837ASemiconductor memory device having cross-point DRAM cell structureTOSHIBA KK·Filed 1991·Granted Jan 25, 1994·52 cites·11 claims
- 1881US6506634B1Semiconductor memory device and method for producing sameTOSHIBA KK·Filed 2000·Granted Jan 14, 2003·25 cites·4 claims
- 1981US6362042B1DRAM having a cup-shaped storage node electrode recessed within an insulating layerTOSHIBA KK·Filed 2000·Granted Mar 26, 2002·22 cites·13 claims
- 2081US6329683B2Semiconductor memory device and manufacturing method thereof which make it possible to improve reliability of cell-capacitor and also to simplify the manufacturing processesTOSHIBA KK·Filed 2000·Granted Dec 11, 2001·31 cites·16 claims
- 2179US6020643ASemiconductor memory device having contact holes of differing structureTOSHIBA KK·Filed 1998·Granted Feb 1, 2000·37 cites·12 claims
- 2279US5336917ADynamic memory cell using hollow post shape channel thin-film transistorTOSHIBA KK·Filed 1992·Granted Aug 9, 1994·43 cites·9 claims
- 2378US6153476ASemiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 1998·Granted Nov 28, 2000·49 cites·29 claims
- 2477US5563085AMethod of manufacturing a semiconductor deviceTOSHIBA KK·Filed 1994·Granted Oct 8, 1996·30 cites·9 claims
- 2576US7615813B2Semiconductor device using fuse/anti-fuse systemTOSHIBA KK·Filed 2007·Granted Nov 10, 2009·5 cites·16 claims
- 2676US6198122B1Semiconductor memory and method of fabricating the sameTOSHIBA KK·Filed 1998·Granted Mar 6, 2001·35 cites·13 claims
- 2776US5886411ASemiconductor device using dual damascene technology and method for manufacturing the sameTOSHIBA KK·Filed 1997·Granted Mar 23, 1999·41 cites·12 claims
- 2875US7605042B2SOI bottom pre-doping merged e-SiGe for poly height reductionTOSHIBA AMERICA ELECTRONIC·Filed 2005·Granted Oct 20, 2009·4 cites·9 claims
- 2975US6150690AStructure of a capacitor section of a dynamic random-access memoryTOSHIBA KK·Filed 1998·Granted Nov 21, 2000·27 cites·33 claims
- 3072US6812542B2Electric fuse whose dielectric breakdown resistance is controlled by injecting impurities into an insulating film of a capacitor structure, and a method for manufacturing the sameTOSHIBA KK·Filed 2001·Granted Nov 2, 2004·18 cites·3 claims
- 3171US5616961AStructure of contact between wiring layers in semiconductor integrated circuit deviceTOSHIBA KK·Filed 1995·Granted Apr 1, 1997·34 cites·37 claims
- 3271US5482869AGettering of unwanted metal impurity introduced into semiconductor substrate during trench formationTOSHIBA KK·Filed 1994·Granted Jan 9, 1996·45 cites·11 claims
- 3369US7859073B2Back-illuminated type solid-state image pickup device and camera module using the sameTOSHIBA KK·Filed 2008·Granted Dec 28, 2010·4 cites·8 claims
- 3469US7537981B2Silicon on insulator device and method of manufacturing the sameTOSHIBA KK·Filed 2007·Granted May 26, 2009·3 cites·34 claims
- 3568US6303429B1Structure of a capacitor section of a dynamic random-access memoryTOSHIBA KK·Filed 2000·Granted Oct 16, 2001·10 cites·16 claims
- 3667US7075169B2Semiconductor device having a hollow region and method of manufacturing the sameTOSHIBA KK·Filed 2003·Granted Jul 11, 2006·12 cites·4 claims
- 3767US6608356B1Semiconductor device using damascene technique and manufacturing method thereforTOSHIBA KK·Filed 1997·Granted Aug 19, 2003·20 cites·14 claims
- 3867US6534814B2Method of manufacturing a semiconductor memory device having a trench capacitor with sufficient capacitance and small junction leak currentTOSHIBA KK·Filed 2000·Granted Mar 18, 2003·9 cites·25 claims
- 3967US6140673ASemiconductor memory device and fabricating methodTOSHIBA KK·Filed 1997·Granted Oct 31, 2000·26 cites·14 claims
- 4066US7550355B2Low-leakage transistor and manufacturing method thereofTOSHIBA AMERICA ELECTRONIC·Filed 2005·Granted Jun 23, 2009·2 cites·11 claims
- 4166US6977228B2Semiconductor device using damascene technique and manufacturing method thereforTOSHIBA KK·Filed 2003·Granted Dec 20, 2005·9 cites·13 claims
- 4266US6448618B1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2000·Granted Sep 10, 2002·21 cites·22 claims
- 4365US6551894B1Stacked capacitor-type semiconductor storage device and manufacturing method thereofTOSHIBA KK·Filed 2000·Granted Apr 22, 2003·8 cites·20 claims
- 4463US7696537B2Step-embedded SiGe structure for PFET mobility enhancementTOSHIBA AMERICA ELECTRONIC·Filed 2005·Granted Apr 13, 2010·2 cites·14 claims
- 4561US6906419B2Semiconductor device having a wiring layer of damascene structure and method for manufacturing the sameTOSHIBA KK·Filed 2001·Granted Jun 14, 2005·5 cites·15 claims
- 4659US6635933B2Structure of a capacitor section of a dynamic random-access memoryTOSHIBA KK·Filed 2001·Granted Oct 21, 2003·6 cites·40 claims
- 4759US6593202B2Semiconductor memory device and fabrication method thereofTOSHIBA KK·Filed 2001·Granted Jul 15, 2003·5 cites·13 claims
- 4858US6130450AStacked capacitor-type semiconductor storage device and manufacturing method thereofTOSHIBA KK·Filed 1996·Granted Oct 10, 2000·15 cites·51 claims
- 4958US5691550ASemiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 1995·Granted Nov 25, 1997·14 cites·8 claims
- 5058US5521407ASemiconductor memory device having cell isolation structureTOSHIBA KK·Filed 1994·Granted May 28, 1996·15 cites·16 claims
Showing the top 50 of 89 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →