Inventor · disambiguated record
Vitali Sokhin
Also filed as: SOKHIN VITALI
20 granted patents·53 citations·filing 2011–2022
92Inventor score
Top patents by PatentIndex Score
20 records- 0192US11226370B1Recoverable exceptions generation and handling for post-silicon validationIBM·Filed 2020·Granted Jan 18, 2022·5 cites·20 claims
- 0289US11263150B2Testing address translation cacheIBM·Filed 2020·Granted Mar 1, 2022·3 cites·20 claims
- 0384US11194705B2Automatically introducing register dependencies to testsIBM·Filed 2020·Granted Dec 7, 2021·2 cites·18 claims
- 0483US10496449B1Verification of atomic memory operationsIBM·Filed 2018·Granted Dec 3, 2019·6 cites·19 claims
- 0583US8832502B2Hardware verification using acceleration platformDUSANAPUDI MANOJ·Filed 2012·Granted Sep 9, 2014·11 cites·16 claims
- 0678US9626267B2Test generation using expected mode of the target hardware deviceSAMSUNG LTD·Filed 2015·Granted Apr 18, 2017·4 cites·20 claims
- 0778US9569345B2Architectural failure analysisIBM·Filed 2013·Granted Feb 14, 2017·6 cites·20 claims
- 0877US10528443B2Validation of multiprocessor hardware componentSAMSUNG LTD·Filed 2015·Granted Jan 7, 2020·3 cites·16 claims
- 0975US8892386B2Method and apparatus for post-silicon testingADIR ALLON·Filed 2011·Granted Nov 18, 2014·5 cites·18 claims
- 1073US11204859B2Partial-results post-silicon hardware exerciserIBM·Filed 2019·Granted Dec 21, 2021·2 cites·15 claims
- 1172US11200126B2Utilizing translation tables for testing processorsIBM·Filed 2020·Granted Dec 14, 2021·1 cites·20 claims
- 1272US9633155B1Circuit modificationIBM·Filed 2015·Granted Apr 25, 2017·2 cites·20 claims
- 1369US9251045B2Control flow error localizationIBM·Filed 2014·Granted Feb 2, 2016·3 cites·20 claims
- 1461US10983887B2Validation of multiprocessor hardware componentIBM·Filed 2019·Granted Apr 20, 2021·0 cites·19 claims
- 1560US11796593B2Compiler-based code generation for post-silicon validationSYNOPSYS INC·Filed 2021·Granted Oct 24, 2023·0 cites·20 claims
- 1658US11928051B2Test space sampling for model-based biased random system test through rest APIIBM·Filed 2022·Granted Mar 12, 2024·0 cites·20 claims
- 1755US11748238B2Model-based biased random system test through rest APIIBM·Filed 2021·Granted Sep 5, 2023·0 cites·20 claims
- 1852US10891163B2Attribute driven memory allocationIBM·Filed 2019·Granted Jan 12, 2021·0 cites·15 claims
- 1948US11182265B2Method and apparatus for test generationIBM·Filed 2019·Granted Nov 23, 2021·0 cites·19 claims
- 2047US10282232B2Attribute driven memory allocationIBM·Filed 2017·Granted May 7, 2019·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →