Inventor · disambiguated record
Sung-Ok Kim
Also filed as: KIM SUNG-OK
10 granted patents·1 pending application·63 citations·filing 2001–2021
87Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11
Top patents by PatentIndex Score
11 records- 0178US6903567B2Test apparatus having multiple test sites at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 7, 2005·17 cites·3 claims
- 0276US7378864B2Test apparatus having multiple test sites at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted May 27, 2008·4 cites·4 claims
- 0375US6857090B2System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Feb 15, 2005·20 cites·41 claims
- 0474US7230417B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 12, 2007·5 cites·23 claims
- 0563US7602172B2Test apparatus having multiple head boards at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Oct 13, 2009·1 cites·4 claims
- 0663US6960908B2Method for electrical testing of semiconductor package that detects socket defects in real timeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Nov 1, 2005·14 cites·13 claims
- 0761US12072370B2Semiconductor package test apparatus and methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 27, 2024·0 cites·13 claims
- 0850US7408339B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 5, 2008·1 cites·12 claims
- 0947US9880418B2Display apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jan 30, 2018·0 cites·20 claims
- 1044US6922050B2Method for testing a remnant batch of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 26, 2005·1 cites·12 claims
- 1144US2009140761A1Method of testing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →