Inventor · disambiguated record
Dae-Gab Chi
Also filed as: CHI DAE-GAB
5 granted patents·21 citations·filing 2004–2010
73Inventor score
Top patents by PatentIndex Score
5 records- 0174US7230417B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 12, 2007·5 cites·23 claims
- 0263US6960908B2Method for electrical testing of semiconductor package that detects socket defects in real timeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Nov 1, 2005·14 cites·13 claims
- 0350US7408339B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 5, 2008·1 cites·12 claims
- 0444US6922050B2Method for testing a remnant batch of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 26, 2005·1 cites·12 claims
- 0529US8400174B2Method of correcting a position of a proberOH SEUNG-YONG·Filed 2010·Granted Mar 19, 2013·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →