Inventor · disambiguated record
Wen-Tsung Lee
Also filed as: LEE WEN-TSUNG
17 granted patents·6 pending applications·60 citations·filing 2001–2022
89Inventor score
Files withCHUNGHWA PREC TEST TECH CO LTD17LEE WEN-TSUNG2CHEN LI-KUO1COLORATIVE CO LTD1IND TECH RES INST1
Top patents by PatentIndex Score
23 records- 0195US11226354B1Probe card device and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Jan 18, 2022·6 cites·9 claims
- 0291US10845385B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Nov 24, 2020·5 cites·6 claims
- 0384US6523959B2Cooling device for liquid crystal projectorsIND TECH RES INST·Filed 2001·Granted Feb 25, 2003·40 cites·17 claims
- 0480US10845387B2Probe card device and matching probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Nov 24, 2020·2 cites·10 claims
- 0564US8264249B2Vertical probe cardLEE WEN-TSUNG·Filed 2009·Granted Sep 11, 2012·6 cites·13 claims
- 0656US10520803B2Projector deviceCOLORATIVE CO LTD·Filed 2018·Granted Dec 31, 2019·1 cites·10 claims
- 0749US11933817B2Probe card device and transmission structureCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Mar 19, 2024·0 cites·5 claims
- 0848US11287446B2Split thin-film probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Mar 29, 2022·0 cites·6 claims
- 0947US11209461B2Probe card device and neck-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 28, 2021·0 cites·8 claims
- 1046US10845388B2Probe card device and probe head thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Nov 24, 2020·0 cites·10 claims
- 1145US11204371B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 21, 2021·0 cites·6 claims
- 1245US11175313B1Thin-film probe card and test module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Nov 16, 2021·0 cites·10 claims
- 1345US11009526B2Probe card device and three-dimensional signal transfer structure thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted May 18, 2021·0 cites·8 claims
- 1445US10775412B2Probe card testing device and testing deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Sep 15, 2020·0 cites·10 claims
- 1544US11073537B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Jul 27, 2021·0 cites·7 claims
- 1644US11009524B2High speed probe card device and rectangular probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted May 18, 2021·0 cites·10 claims
- 1744US2022011346A1Probe card device and fan-out probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Application pending·0 cites
- 1843US2007139887A1Portable projector using an LED and related heat dissipating systemPREMIER IMAGE TECHNOLOGY CORP·Filed 2006·Application pending·0 cites
- 1942US10705117B2Probe assembly and probe structure thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Jul 7, 2020·0 cites·9 claims
- 2036US2014084955A1Fine pitch interposer structureCHUNGHWA PREC TEST TECH CO LTD·Filed 2013·Application pending·0 cites
- 2135US2009045828A1Fine Pitch Testing Substrate Structure And Method Of Manufacturing The SameCHEN LI-KUO·Filed 2008·Application pending·0 cites
- 2233US2012187972A1Wafer level testing structureLEE WEN-TSUNG·Filed 2011·Application pending·0 cites
- 2331US2016349315A1Multilayer interposer with high bonding strengthCHUNGHWA PREC TEST TECH CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →