Inventor · disambiguated record
Mitsuo Ishii
Also filed as: ISHII MITSUO
94 granted patents·1,328 citations·filing 1975–2023
99Inventor score
Top patents by PatentIndex Score
94 records- 0194US5163202ADust detector for vacuum cleanerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Nov 17, 1992·222 cites·7 claims
- 0293US4988165AObject lens driving deviceSHARP KK·Filed 1989·Granted Jan 29, 1991·55 cites·9 claims
- 0391US6918971B2Titanium sheet, plate, bar or wire having high ductility and low material anisotropy and method of producing the sameNIPPON STEEL CORP·Filed 2002·Granted Jul 19, 2005·37 cites·4 claims
- 0486USD469738SRotating laserTOPCON CORP·Filed 2001·Granted Feb 4, 2003·32 cites·1 claims
- 0585USD325394SMotorized adhesive tape dispenserELM IND CO LTD·Filed 1990·Granted Apr 14, 1992·27 cites·1 claims
- 0684US4465525AFerritic stainless steel having excellent formabilityNIPPON STEEL CORP·Filed 1982·Granted Aug 14, 1984·32 cites·5 claims
- 0782US5313444AExternal magnetic field generation apparatus capable of light intensity modulation and magnetic field modulationSHARP KK·Filed 1992·Granted May 17, 1994·32 cites·14 claims
- 0882US4104727ALiquid crystal display calculator constructionSHARP KK·Filed 1976·Granted Aug 1, 1978·22 cites·22 claims
- 0981US4515644AMethod for producing ferritic stainless steel sheets or strips containing aluminumNIPPON STEEL CORP·Filed 1981·Granted May 7, 1985·20 cites·13 claims
- 1080USD971037SSurveying instrumentTOPCON CORP·Filed 2021·Granted Nov 29, 2022·7 cites·1 claims
- 1180USD563246SRoof of rotating laser having telescopic sightTOPCON CORP·Filed 2007·Granted Mar 4, 2008·27 cites·1 claims
- 1280USD494074SOptical measuring theodoliteTOPCON CORP·Filed 2003·Granted Aug 10, 2004·24 cites·1 claims
- 1379USD723398SLight wave distance measuring theodoliteTOPCON CORP·Filed 2013·Granted Mar 3, 2015·22 cites·1 claims
- 1479USD409507SElectro-optical distance-measuring instrumentKK TOPCON·Filed 1998·Granted May 11, 1999·21 cites·1 claims
- 1578USD723953SMeasuring device for measuring in three-dimensionTOPCON CORP·Filed 2014·Granted Mar 10, 2015·21 cites·1 claims
- 1676USD609124SRotating laserTOPCON CORP·Filed 2009·Granted Feb 2, 2010·21 cites·1 claims
- 1776US5224068ARecording method for magneto-optic memory mediumSHARP KK·Filed 1991·Granted Jun 29, 1993·23 cites·6 claims
- 1875USD781730SOptical measuring theodolite using light waveKK TOPCON·Filed 2015·Granted Mar 21, 2017·16 cites·1 claims
- 1974USD777588SOptical measuring theodolite using light waveKK TOPCON·Filed 2015·Granted Jan 31, 2017·15 cites·1 claims
- 2074USD563247SThree-dimensional measuring instrumentTOPCON CORP·Filed 2007·Granted Mar 4, 2008·19 cites·1 claims
- 2173USD781731SOptical measuring theodolite using light waveKK TOPCON·Filed 2015·Granted Mar 21, 2017·14 cites·1 claims
- 2273USD766753SOptical measuring thedolite using light waveKK TOPCON·Filed 2015·Granted Sep 20, 2016·15 cites·1 claims
- 2373US7903519B2Recording mark formation method, information recording device, information recording method, and information recording mediumSHARP KK·Filed 2006·Granted Mar 8, 2011·2 cites·18 claims
- 2472USD587149SLaser irradiatorTOPCON CORP·Filed 2008·Granted Feb 24, 2009·18 cites·1 claims
- 2572US6920163B2Semiconductor laser driving circuit and semiconductor laser driving method thereforSHARP KK·Filed 2002·Granted Jul 19, 2005·10 cites·6 claims
- 2672US6751522B2Lens layout setting apparatus for lens grinding process and display apparatus for the sameTOPCON CORP·Filed 2001·Granted Jun 15, 2004·13 cites·6 claims
- 2771USD684068SLight wave distance measuring theodoliteISHII MITSUO·Filed 2012·Granted Jun 11, 2013·17 cites·1 claims
- 2871USD429481SRotating laserTOPCON CORP·Filed 1997·Granted Aug 15, 2000·15 cites·1 claims
- 2970USD708970SLaser surveying instrumentTOPCON CORP·Filed 2013·Granted Jul 15, 2014·15 cites·1 claims
- 3069USD336838SElectric staplerELM IND CO LTD·Filed 1991·Granted Jun 29, 1993·13 cites·1 claims
- 3168USD335300SStamperELM IND CO LTD·Filed 1989·Granted May 4, 1993·11 cites·1 claims
- 3268US4054909AMethod and system for bandwidth-compressed transmission of a video signal in the NTSC systemFUJITSU LTD·Filed 1975·Granted Oct 18, 1977·19 cites·21 claims
- 3367USD635038SRotating laserTOPCON CORP·Filed 2010·Granted Mar 29, 2011·14 cites·1 claims
- 3467USD561621SRotating laserTOPCON CORP·Filed 2007·Granted Feb 12, 2008·15 cites·1 claims
- 3567US4995687ASemiconductor laser device and a method of producing sameMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Feb 26, 1991·26 cites·4 claims
- 3666USD558075SLaser transitTOPCON CORP·Filed 2006·Granted Dec 25, 2007·14 cites·1 claims
- 3764USD834968SLight wave distance measuring theodoliteTOPCON CORP·Filed 2017·Granted Dec 4, 2018·9 cites·1 claims
- 3864USD564922SLaser irradiatorTOPCON CORP·Filed 2006·Granted Mar 25, 2008·13 cites·1 claims
- 3964US5108517AProcess for preparing titanium and titanium alloy materials having a fine equiaxed microstructureNIPPON STEEL CORP·Filed 1990·Granted Apr 28, 1992·15 cites·16 claims
- 4062US5359466AMagnetic head driving circuit with impedance elements to balance auxiliary coil loadsSHARP KK·Filed 1992·Granted Oct 25, 1994·13 cites·18 claims
- 4162US4947238ASubmount for semiconductor laser elementMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Aug 7, 1990·13 cites·5 claims
- 4261USD795721SSurveying instrumentTOPCON CORP·Filed 2016·Granted Aug 29, 2017·8 cites·1 claims
- 4360USD450254SEyepiece section of an optical distance measuring instrumentTOPCON CORP·Filed 2000·Granted Nov 13, 2001·11 cites·1 claims
- 4460US5125986AProcess for preparing titanium and titanium alloy having fine acicular microstructureNIPPON STEEL CORP·Filed 1990·Granted Jun 30, 1992·14 cites·6 claims
- 4559USD778745SOptical measuring theodolite using light waveKK TOPCON·Filed 2015·Granted Feb 14, 2017·8 cites·1 claims
- 4659USD532326SCalculator for surveying dateTOPCON CORP·Filed 2004·Granted Nov 21, 2006·10 cites·1 claims
- 4759USD376111SLaser measurement equipmentKK TOPCON·Filed 1996·Granted Dec 3, 1996·10 cites·1 claims
- 4859US5092940AProcess for production of titanium and titanium alloy material having fine equiaxial microstructureNIPPON STEEL CORP·Filed 1990·Granted Mar 3, 1992·12 cites·7 claims
- 4958USD835532SSurveying instrumentTOPCON CORP·Filed 2017·Granted Dec 11, 2018·7 cites·1 claims
- 5058USD612753SRotating laserTOPCON CORP·Filed 2009·Granted Mar 30, 2010·10 cites·1 claims
Showing the top 50 of 94 patent records by PatentIndex Score.
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