Inventor · disambiguated record
Kazushi Hayashi
Also filed as: HAYASHI KAZUSHI
24 granted patents·13 pending applications·571 citations·filing 1994–2022
95Inventor score
Top patents by PatentIndex Score
37 records- 0198US7311977B2Highly-oriented diamond film, method for manufacturing the same, and electronic device having highly-oriented diamond filmKOBE STEEL LTD·Filed 2005·Granted Dec 25, 2007·280 cites·3 claims
- 0295US7193241B2Ultraviolet sensor and method for manufacturing the sameKOBE STEEL LTD·Filed 2005·Granted Mar 20, 2007·51 cites·3 claims
- 0394US7067903B2Heat spreader and semiconductor device and package using the sameKOBE STEEL LTD·Filed 2003·Granted Jun 27, 2006·103 cites·5 claims
- 0484US10090208B2Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation methodKOBE STEEL LTD·Filed 2014·Granted Oct 2, 2018·6 cites·20 claims
- 0578US7285479B2Semiconductor device and method for manufacturing multilayered substrate for semiconductor deviceKOBE STEEL LTD·Filed 2006·Granted Oct 23, 2007·6 cites·5 claims
- 0672US6383288B1Method of forming diamond filmKOBE STEEL LTD·Filed 1999·Granted May 7, 2002·24 cites·13 claims
- 0771US7897025B2Method and apparatus for forming thin filmKOBE STEEL LTD·Filed 2004·Granted Mar 1, 2011·11 cites·18 claims
- 0870US7539401B2Heating unit and resin sheet heating apparatusASANO LAB CO LTD·Filed 2006·Granted May 26, 2009·3 cites·4 claims
- 0969US9583633B2Oxide for semiconductor layer of thin film transistor, thin film transistor and display deviceSAMSUNG DISPLAY CO LTD·Filed 2014·Granted Feb 28, 2017·2 cites·6 claims
- 1066US9816944B2Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation methodKOBE STEEL LTD·Filed 2014·Granted Nov 14, 2017·1 cites·20 claims
- 1164US5479875AFormation of highly oriented diamond filmKOBE STEEL LTD·Filed 1994·Granted Jan 2, 1996·23 cites·16 claims
- 1261US2025164422A1Method for calculating film thickness of grain boundary oxide layer, method for determining plating properties, method for manufacturing plated steel sheet, and film thickness calculation deviceKOBE STEEL LTD·Filed 2022·Application pending·0 cites
- 1360US7323664B1Heating systemASANO LAB CO LTD·Filed 2006·Granted Jan 29, 2008·2 cites·2 claims
- 1459US5424561AMagnetic sensor element using highly-oriented diamond film and magnetic detectorKOBE STEEL INC·Filed 1994·Granted Jun 13, 1995·15 cites·22 claims
- 1557US2009098311A1Method for forming thin filmASAHI GLASS CO LTD·Filed 2008·Application pending·0 cites
- 1654US7064352B2Diamond semiconductor device and method for manufacturing the sameKOBE STEEL LTD·Filed 2004·Granted Jun 20, 2006·6 cites·10 claims
- 1753US2010219350A1Beam Detector and Beam Monitor Using The SameKOBASHI KOJI·Filed 2007·Application pending·0 cites
- 1848US9316589B2Method for evaluating oxide semiconductor thin film, and method for quality control of oxide semiconductor thin filmKOBE STEEL LTD·Filed 2013·Granted Apr 19, 2016·0 cites·12 claims
- 1946US7495194B2Heating apparatus and heating methodASANO LAB CO LTD·Filed 2006·Granted Feb 24, 2009·0 cites·5 claims
- 2046US7459187B2Surface-treatment method and equipmentKOBE STEEL LTD·Filed 2004·Granted Dec 2, 2008·1 cites·27 claims
- 2146US5436505AHeat-resisting ohmic contact on semiconductor diamond layerKOBE STEEL LTD·Filed 1994·Granted Jul 25, 1995·14 cites·4 claims
- 2246US2006001029A1Diamond sensorKOBE STEEL LTD·Filed 2005·Application pending·0 cites
- 2345US2008083733A1Radiant heaterTAKAI TOSHIHIRO·Filed 2006·Application pending·0 cites
- 2444US2022274952A1Cyclic azine compound, material for organic light emitting diode, electron transport material for organic light emitting diode, and organic light emitting diodeTOSOH CORP·Filed 2020·Application pending·0 cites
- 2543US5529846AHighly-oriented diamond film heat dissipating substrateKOBE STEEL INC·Filed 1995·Granted Jun 25, 1996·11 cites·6 claims
- 2643US2016223462A1Evaluation device for oxide semiconductor thin filmKOBE STEEL LTD·Filed 2014·Application pending·0 cites
- 2743US2006161695A1Direct memory access systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 2843US2007039666A1Copper base for electronic component, electronic component, and process for producing copper base for electronic componentKOBE STEEL LTD·Filed 2006·Application pending·0 cites
- 2942US2012046931A1Multiple power-supply simulation result analyzer and method of analyzing the sameTAKAHASHI HIROSHI·Filed 2011·Application pending·0 cites
- 3041US10203367B2Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin filmKOBE STEEL LTD·Filed 2015·Granted Feb 12, 2019·0 cites·13 claims
- 3141US9780005B2Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin filmKOBE STEEL LTD·Filed 2015·Granted Oct 3, 2017·0 cites·14 claims
- 3240US10475711B2Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing qualityKOBE STEEL LTD·Filed 2017·Granted Nov 12, 2019·0 cites·9 claims
- 3335US6198218B1Organic light emitting device using diamond filmKOBE STEEL LTD·Filed 1998·Granted Mar 6, 2001·12 cites·12 claims
- 3435US2015364553A1Oxide for semiconductor layer of thin film transistor, thin film transistor, and display deviceKOBE STEEL LTD·Filed 2014·Application pending·0 cites
- 3534US2018219220A1Negative electrode for iron-air secondary battery, iron-air secondary battery, and production method of negative electrode for iron-air secondary batteryKOBE STEEL LTD·Filed 2016·Application pending·0 cites
- 3633US2015357474A1Oxide for semiconductor layer of thin film transistor, thin film transistor, and display deviceKOBE STEEL LTD·Filed 2014·Application pending·0 cites
- 3729US9279762B2Apparatus and method for measuring semiconductor carrier lifetimeHAYASHI KAZUSHI·Filed 2010·Granted Mar 8, 2016·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →