Inventor · disambiguated record
Patrick D. Mcnamara
Also filed as: MCNAMARA PATRICK · MCNAMARA PATRICK D
10 granted patents·1 pending application·124 citations·filing 2000–2019
88Inventor score
Top patents by PatentIndex Score
11 records- 0188US6978229B1Efficient method for modeling and simulation of the impact of local and global variation on integrated circuitsPDF SOLUTIONS INC·Filed 2000·Granted Dec 20, 2005·53 cites·6 claims
- 0284US9395775B2Control scheme to temporarily raise supply voltage in response to sudden change in current demandAPPLE INC·Filed 2013·Granted Jul 19, 2016·6 cites·20 claims
- 0380US7003742B2Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded coresPDF SOLUTIONS INC·Filed 2003·Granted Feb 21, 2006·26 cites·14 claims
- 0478US8578143B2Modifying operating parameters based on device useFRANK MICHAEL·Filed 2011·Granted Nov 5, 2013·4 cites·22 claims
- 0576US8170828B2Test method using memory programmed with tests and protocol to communicate between device under test and testerMCNAMARA PATRICK D·Filed 2009·Granted May 1, 2012·12 cites·13 claims
- 0671US9541603B2Method and apparatus for power glitch detection in integrated circuitsAPPLE INC·Filed 2013·Granted Jan 10, 2017·3 cites·17 claims
- 0769US7047505B2Method for optimizing the characteristics of integrated circuits components from circuit specificationsPDF SOLUTIONS INC·Filed 2001·Granted May 16, 2006·19 cites·16 claims
- 0863US11079831B2Control scheme to temporarily raise supply voltage in response to sudden change in current demandAPPLE INC·Filed 2019·Granted Aug 3, 2021·0 cites·20 claims
- 0956US10241560B2Control scheme to temporarily raise supple voltage in response to sudden change in current demandAPPLE INC·Filed 2016·Granted Mar 26, 2019·0 cites·13 claims
- 1055US2011106573A1Automated meeting schedulingAPPLE INC·Filed 2009·Application pending·0 cites
- 1154US8836366B2Method for testing integrated circuits with hysteresisHOANG ANH T·Filed 2012·Granted Sep 16, 2014·1 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →