Inventor · disambiguated record

Arijit Raychowhury

Also filed as: RAYCHOWHURY ARIJIT

1 granted patent·4 citations·filing 2005–2005

25Inventor score

Technology areasG01R

Files withPURDUE RES FOUNDATION PURDUE U1

Top patents by PatentIndex Score

1 record

0155US7319343B2Low power scan design and delay fault testing technique using first level supply gatingPURDUE RES FOUNDATION PURDUE U·Filed 2005·Granted Jan 15, 2008·4 cites·51 claims

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