Inventor · disambiguated record
Tokuya Osawa
Also filed as: OSAWA TOKUYA
16 granted patents·1 pending application·352 citations·filing 1995–2010
95Inventor score
Top patents by PatentIndex Score
17 records- 0193US7724606B2Interface circuitRENESAS TECH CORP·Filed 2007·Granted May 25, 2010·27 cites·9 claims
- 0286US5960008ATest circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Sep 28, 1999·62 cites·15 claims
- 0386US5815512ASemiconductor memory testing deviceMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Sep 29, 1998·56 cites·33 claims
- 0482US5946247ASemiconductor memory testing deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 31, 1999·44 cites·8 claims
- 0566US7983112B2Semiconductor device which transmits or receives a signal to or from an external memory by a DDR systemRENESAS ELECTRONICS CORP·Filed 2008·Granted Jul 19, 2011·6 cites·6 claims
- 0666US7535251B2Semiconductor device and impedance adjusting method thereofRENESAS TECH CORP·Filed 2007·Granted May 19, 2009·5 cites·7 claims
- 0766US6742149B2Apparatus for testing semiconductor integrated circuitsRENESAS TECH CORP·Filed 2001·Granted May 25, 2004·12 cites·3 claims
- 0866US6275963B1Test circuit and a redundancy circuit for an internal memory circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 14, 2001·25 cites·20 claims
- 0961US6286121B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Sep 4, 2001·23 cites·10 claims
- 1059US5703818ATest circuitMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Dec 30, 1997·20 cites·17 claims
- 1158US5636225AMemory test circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jun 3, 1997·19 cites·12 claims
- 1251US5905737ATest circuitMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 18, 1999·13 cites·11 claims
- 1350US5724367ASemiconductor memory device having scan path for testingMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Mar 3, 1998·13 cites·14 claims
- 1447US5903579AScan path forming circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted May 11, 1999·12 cites·20 claims
- 1543US6571364B1Semiconductor integrated circuit device with fault analysis functionMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 27, 2003·10 cites·16 claims
- 1640US2010257324A1Interface circuitRENESAS TECH CORP·Filed 2010·Application pending·0 cites
- 1737US6397363B1Semiconductor integrated circuit device with test circuitMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 28, 2002·5 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →