Inventor · disambiguated record
Hidehisa Hashizume
Also filed as: HASHIZUME HIDEHISA
6 granted patents·54 citations·filing 1993–2016
81Inventor score
Top patents by PatentIndex Score
6 records- 0161US8228509B2Shape measuring deviceAKAMATSU MASARU·Filed 2008·Granted Jul 24, 2012·5 cites·9 claims
- 0249US5760597AMethod of and apparatus for measuring lifetime of carriers in semiconductor sampleKOBE STEEL LTD·Filed 1996·Granted Jun 2, 1998·17 cites·14 claims
- 0349US5438276AApparatus for measuring the life time of minority carriers of a semiconductor waferKOBE STEEL LTD·Filed 1993·Granted Aug 1, 1995·15 cites·13 claims
- 0448US8310536B2Shape measurement apparatus and shape measurement methodAKAMATSU MASARU·Filed 2008·Granted Nov 13, 2012·2 cites·20 claims
- 0542US5430386AMethod and apparatus for evaluating semiconductor wafers by irradiation with microwave and excitation lightLEO CORP·Filed 1993·Granted Jul 4, 1995·15 cites·12 claims
- 0630US10371503B2Shape measurement method and shape measurement deviceKOBELCO RES INSTITUTE INC·Filed 2016·Granted Aug 6, 2019·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →