Inventor · disambiguated record
Yasuhide Nakai
Also filed as: NAKAI YASUHIDE
5 granted patents·150 citations·filing 1980–2008
81Inventor score
Top patents by PatentIndex Score
5 records- 0188US4874939AMethod and apparatus for detecting position/variance of input light using linear and quadratic outputsKOBE STEEL LTD·Filed 1987·Granted Oct 17, 1989·83 cites·9 claims
- 0282US4319270ASurface inspection system for hot radiant materialKOBE STEEL LTD·Filed 1980·Granted Mar 9, 1982·45 cites·5 claims
- 0361US8228509B2Shape measuring deviceAKAMATSU MASARU·Filed 2008·Granted Jul 24, 2012·5 cites·9 claims
- 0448US8310536B2Shape measurement apparatus and shape measurement methodAKAMATSU MASARU·Filed 2008·Granted Nov 13, 2012·2 cites·20 claims
- 0542US5430386AMethod and apparatus for evaluating semiconductor wafers by irradiation with microwave and excitation lightLEO CORP·Filed 1993·Granted Jul 4, 1995·15 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →