Inventor · disambiguated record
Tso-Hui Ting
Also filed as: TING TSO-HUI
15 granted patents·1 pending application·65 citations·filing 2007–2016
90Inventor score
Top patents by PatentIndex Score
16 records- 0195US8237278B2Configurable interposerGLUSCHENKOV OLEG·Filed 2009·Granted Aug 7, 2012·29 cites·11 claims
- 0283US9524930B2Configurable interposerIBM·Filed 2014·Granted Dec 20, 2016·4 cites·11 claims
- 0383US7856332B2Real time system for monitoring the commonality, sensitivity, and repeatability of test probesIBM·Filed 2007·Granted Dec 21, 2010·13 cites·22 claims
- 0481US8742782B2Noncontact electrical testing with optical techniquesOUYANG XU·Filed 2011·Granted Jun 3, 2014·5 cites·12 claims
- 0576US8159247B2Yield enhancement for stacked chips through rotationally-connecting-interposerGLUSCHENKOV OLEG·Filed 2009·Granted Apr 17, 2012·4 cites·15 claims
- 0675US9354252B2Pressure sensing and control for semiconductor wafer probingIBM·Filed 2014·Granted May 31, 2016·2 cites·20 claims
- 0772US8963567B2Pressure sensing and control for semiconductor wafer probingEDWARDS ROBERT D·Filed 2011·Granted Feb 24, 2015·2 cites·17 claims
- 0861US8489225B2Wafer alignment system with optical coherence tomographyXIN YONGCHUN·Filed 2011·Granted Jul 16, 2013·2 cites·20 claims
- 0960US7908023B2Method of establishing a lot grade system for product lots in a semiconductor manufacturing processIBM·Filed 2008·Granted Mar 15, 2011·2 cites·19 claims
- 1058US9702930B2Semiconductor wafer probing system including pressure sensing and control unitIBM·Filed 2016·Granted Jul 11, 2017·0 cites·20 claims
- 1154US8759152B2Configurable interposerGLUSCHENKOV OLEG·Filed 2012·Granted Jun 24, 2014·0 cites·10 claims
- 1251US9151781B2Yield enhancement for stacked chips through rotationally-connecting-interposerGLUSCHENKOV OLEG·Filed 2012·Granted Oct 6, 2015·0 cites·20 claims
- 1345US8299809B2In-line characterization of a device under testTING TSO-HUI·Filed 2009·Granted Oct 30, 2012·2 cites·14 claims
- 1443US9780007B2LCR test circuit structure for detecting metal gate defect conditionsOUYANG XU·Filed 2012·Granted Oct 3, 2017·0 cites·15 claims
- 1541US2009125829A1Automated yield split lot (ewr) and process change notification (pcn) analysis systemIBM·Filed 2007·Application pending·0 cites
- 1640US8429193B2Security control of analysis resultsSONG YUNSHENG·Filed 2009·Granted Apr 23, 2013·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →