Inventor · disambiguated record
Keng-Chia Yang
Also filed as: YANG KENG-CHIA
4 granted patents·2 pending applications·92 citations·filing 2000–2007
73Inventor score
Top patents by PatentIndex Score
6 records- 0186US6470231B1Method and system for auto dispatching waferTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Oct 22, 2002·87 cites·67 claims
- 0248US7587293B2Semiconductor CP (circuit probe) test management system and methodTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Sep 8, 2009·2 cites·18 claims
- 0339US7383259B2Method and system for merging wafer test resultsTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Jun 3, 2008·1 cites·36 claims
- 0437US7123040B2System and method for check-in control in wafer testingTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 17, 2006·2 cites·10 claims
- 0534US2005192690A1Chip probing equipment and test modeling for next generation MES (300MM)TAIWAN SEMICONDUCTOR MFG·Filed 2004·Application pending·0 cites
- 0630US2006100844A1Test time forecast system and method thereofYANG KENG-CHIA·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →