Inventor · disambiguated record
Chikako Tokunaga
Also filed as: TOKUNAGA CHIKAKO
19 granted patents·4 pending applications·182 citations·filing 2003–2019
94Inventor score
Top patents by PatentIndex Score
23 records- 0191US7653854B2Semiconductor integrated circuit having a (BIST) built-in self test circuit for fault diagnosing operation of a memoryTOSHIBA KK·Filed 2007·Granted Jan 26, 2010·29 cites·18 claims
- 0289US7577885B2Semiconductor integrated circuit, design support software system and automatic test pattern generation systemTOSHIBA KK·Filed 2006·Granted Aug 18, 2009·20 cites·2 claims
- 0386US8037376B2On-chip failure analysis circuit and on-chip failure analysis methodTOSHIBA KK·Filed 2008·Granted Oct 11, 2011·17 cites·17 claims
- 0480US9557379B2Semiconductor integrated circuitTOSHIBA KK·Filed 2015·Granted Jan 31, 2017·2 cites·12 claims
- 0579US7962821B2Built-in self testing circuit with fault diagnostic capabilityTOSHIBA KK·Filed 2008·Granted Jun 14, 2011·12 cites·15 claims
- 0679US7120890B2Apparatus for delay fault testing of integrated circuitsTOSHIBA KK·Filed 2003·Granted Oct 10, 2006·25 cites·20 claims
- 0777US7797591B2Semiconductor integrated circuit, design support software system, and automatic test pattern generation systemTOSHIBA KK·Filed 2009·Granted Sep 14, 2010·9 cites·2 claims
- 0877US7254762B2Semiconductor integrated circuitTOSHIBA KK·Filed 2004·Granted Aug 7, 2007·19 cites·20 claims
- 0975US7734975B2Semiconductor integrated circuit having built-n self test circuit of logic circuit and embedded device, and design apparatus thereofTOSHIBA KK·Filed 2007·Granted Jun 8, 2010·8 cites·16 claims
- 1069US8599632B2Semiconductor integrated circuitANZOU KENICHI·Filed 2012·Granted Dec 3, 2013·4 cites·20 claims
- 1169US7228262B2Semiconductor integrated circuit verification systemTOSHIBA KK·Filed 2004·Granted Jun 5, 2007·16 cites·19 claims
- 1268US8134880B2Semiconductor integrated circuitANZOU KENICHI·Filed 2010·Granted Mar 13, 2012·4 cites·20 claims
- 1367US8032803B2Semiconductor integrated circuit and test system thereofTOSHIBA KK·Filed 2008·Granted Oct 4, 2011·6 cites·20 claims
- 1458US8176372B2Semiconductor integrated circuitANZOU KENICHI·Filed 2009·Granted May 8, 2012·4 cites·11 claims
- 1555US8201037B2Semiconductor integrated circuit and method for controlling semiconductor integrated circuitANZOU KENICHI·Filed 2009·Granted Jun 12, 2012·3 cites·15 claims
- 1654US9443611B2Semiconductor integrated circuit with bist circuitTOSHIBA KK·Filed 2013·Granted Sep 13, 2016·1 cites·14 claims
- 1752US8671317B2Built-in self test circuit and designing apparatusANZOU KENICHI·Filed 2011·Granted Mar 11, 2014·1 cites·18 claims
- 1851US7783942B2Integrated circuit device with built-in self test (BIST) circuitTOSHIBA KK·Filed 2007·Granted Aug 24, 2010·2 cites·20 claims
- 1945US2020096570A1Design method for scan test circuit, design program for scan test circuit and semiconductor integrated circuitTOSHIBA KK·Filed 2019·Application pending·0 cites
- 2040US9159456B2Semiconductor deviceTOSHIBA KK·Filed 2014·Granted Oct 13, 2015·0 cites·20 claims
- 2133US2007011535A1Semiconductor integrated circuitANZOU KENICHI·Filed 2005·Application pending·0 cites
- 2233US2010251043A1Semiconductor integrated circuit, circuit function veryfication device and method of veryfying circuit functionTOSHIBA KK·Filed 2010·Application pending·0 cites
- 2326US2012229155A1Semiconductor integrated circuit, failure diagnosis system and failure diagnosis methodANZOU KENICHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →