Inventor · disambiguated record
Kenichi Anzou
Also filed as: ANZOU KENICHI
26 granted patents·6 pending applications·211 citations·filing 2003–2018
95Inventor score
Top patents by PatentIndex Score
32 records- 0191US7653854B2Semiconductor integrated circuit having a (BIST) built-in self test circuit for fault diagnosing operation of a memoryTOSHIBA KK·Filed 2007·Granted Jan 26, 2010·29 cites·18 claims
- 0289US7206984B2Built-in self test circuit and test method for storage deviceTOSHIBA KK·Filed 2005·Granted Apr 17, 2007·24 cites·6 claims
- 0386US8037376B2On-chip failure analysis circuit and on-chip failure analysis methodTOSHIBA KK·Filed 2008·Granted Oct 11, 2011·17 cites·17 claims
- 0483US9330788B2Semiconductor integrated circuit capable of performing self-testTOSHIBA KK·Filed 2014·Granted May 3, 2016·8 cites·20 claims
- 0580US9557379B2Semiconductor integrated circuitTOSHIBA KK·Filed 2015·Granted Jan 31, 2017·2 cites·12 claims
- 0679US7962821B2Built-in self testing circuit with fault diagnostic capabilityTOSHIBA KK·Filed 2008·Granted Jun 14, 2011·12 cites·15 claims
- 0779US7120890B2Apparatus for delay fault testing of integrated circuitsTOSHIBA KK·Filed 2003·Granted Oct 10, 2006·25 cites·20 claims
- 0877US10359470B2Semiconductor integrated circuit and test method thereofTOSHIBA KK·Filed 2018·Granted Jul 23, 2019·1 cites·9 claims
- 0977US7254762B2Semiconductor integrated circuitTOSHIBA KK·Filed 2004·Granted Aug 7, 2007·19 cites·20 claims
- 1077US7099783B2Semiconductor integrated circuit, design support apparatus, and test methodTOSHIBA KK·Filed 2003·Granted Aug 29, 2006·22 cites·8 claims
- 1175US7734975B2Semiconductor integrated circuit having built-n self test circuit of logic circuit and embedded device, and design apparatus thereofTOSHIBA KK·Filed 2007·Granted Jun 8, 2010·8 cites·16 claims
- 1269US8599632B2Semiconductor integrated circuitANZOU KENICHI·Filed 2012·Granted Dec 3, 2013·4 cites·20 claims
- 1369US7228262B2Semiconductor integrated circuit verification systemTOSHIBA KK·Filed 2004·Granted Jun 5, 2007·16 cites·19 claims
- 1468US8134880B2Semiconductor integrated circuitANZOU KENICHI·Filed 2010·Granted Mar 13, 2012·4 cites·20 claims
- 1567US8032803B2Semiconductor integrated circuit and test system thereofTOSHIBA KK·Filed 2008·Granted Oct 4, 2011·6 cites·20 claims
- 1666US7890823B2Nonvolatile semiconductor memory systemTOSHIBA KK·Filed 2008·Granted Feb 15, 2011·2 cites·11 claims
- 1758US10261127B2Semiconductor integrated circuitTOSHIBA KK·Filed 2017·Granted Apr 16, 2019·1 cites·16 claims
- 1858US8176372B2Semiconductor integrated circuitANZOU KENICHI·Filed 2009·Granted May 8, 2012·4 cites·11 claims
- 1956US10001524B2Semiconductor integrated circuit and test method thereofTOSHIBA KK·Filed 2016·Granted Jun 19, 2018·0 cites·16 claims
- 2055US8201037B2Semiconductor integrated circuit and method for controlling semiconductor integrated circuitANZOU KENICHI·Filed 2009·Granted Jun 12, 2012·3 cites·15 claims
- 2154US9443611B2Semiconductor integrated circuit with bist circuitTOSHIBA KK·Filed 2013·Granted Sep 13, 2016·1 cites·14 claims
- 2252US8671317B2Built-in self test circuit and designing apparatusANZOU KENICHI·Filed 2011·Granted Mar 11, 2014·1 cites·18 claims
- 2351US7783942B2Integrated circuit device with built-in self test (BIST) circuitTOSHIBA KK·Filed 2007·Granted Aug 24, 2010·2 cites·20 claims
- 2442US10706951B2Semiconductor integrated circuit including a memory macroTOSHIBA KK·Filed 2018·Granted Jul 7, 2020·0 cites·11 claims
- 2540US9159456B2Semiconductor deviceTOSHIBA KK·Filed 2014·Granted Oct 13, 2015·0 cites·20 claims
- 2638US9355745B2BIST circuitTOSHIBA KK·Filed 2014·Granted May 31, 2016·0 cites·20 claims
- 2737US2019295678A1Semiconductor integrated circuitTOSHIBA KK·Filed 2018·Application pending·0 cites
- 2836US2004246337A1Self-test executable integrated circuit, a design apparatus thereof, and a scan chain design apparatusTOSHIBA KK·Filed 2004·Application pending·0 cites
- 2934US2012226953A1Semiconductor integrated circuit, design apparatus and design methodNAKAZATO MASATO·Filed 2011·Application pending·0 cites
- 3033US2007011535A1Semiconductor integrated circuitANZOU KENICHI·Filed 2005·Application pending·0 cites
- 3133US2010251043A1Semiconductor integrated circuit, circuit function veryfication device and method of veryfying circuit functionTOSHIBA KK·Filed 2010·Application pending·0 cites
- 3226US2012229155A1Semiconductor integrated circuit, failure diagnosis system and failure diagnosis methodANZOU KENICHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →