Inventor · disambiguated record
Mark E. Masters
Also filed as: MASTERS MARK · MASTERS MARK E · MASTERS MARK ELIOT
17 granted patents·299 citations·filing 1996–2010
95Inventor score
Top patents by PatentIndex Score
17 records- 0194US7535016B2Vertical carbon nanotube transistor integrationIBM·Filed 2005·Granted May 19, 2009·33 cites·20 claims
- 0294US7473633B2Method for making integrated circuit chip having carbon nanotube composite interconnection viasIBM·Filed 2006·Granted Jan 6, 2009·29 cites·18 claims
- 0390US8039334B2Shared gate for conventional planar device and horizontal CNTIBM·Filed 2010·Granted Oct 18, 2011·10 cites·15 claims
- 0489US7674674B2Method of forming a dual gated FinFET gain cellIBM·Filed 2008·Granted Mar 9, 2010·13 cites·10 claims
- 0589US7135773B2Integrated circuit chip utilizing carbon nanotube composite interconnection viasIBM·Filed 2004·Granted Nov 14, 2006·49 cites·17 claims
- 0689US6970372B1Dual gated finfet gain cellIBM·Filed 2004·Granted Nov 29, 2005·37 cites·18 claims
- 0787US7566613B2Method of forming a dual gated FinFET gain cellIBM·Filed 2005·Granted Jul 28, 2009·11 cites·13 claims
- 0887US7484423B2Integrated carbon nanotube sensorsIBM·Filed 2007·Granted Feb 3, 2009·12 cites·19 claims
- 0985US8536526B2Methods of operating a nanoprober to electrically probe a device structure of an integrated circuitBELL PAUL D·Filed 2008·Granted Sep 17, 2013·17 cites·21 claims
- 1081US7247877B2Integrated carbon nanotube sensorsIBM·Filed 2004·Granted Jul 24, 2007·24 cites·15 claims
- 1180US7503021B2Integrated circuit diagnosing method, system, and program productIBM·Filed 2005·Granted Mar 10, 2009·13 cites·17 claims
- 1272US6627926B2Method of designing and structure for visual and electrical test of semiconductor devicesIBM·Filed 2001·Granted Sep 30, 2003·16 cites·2 claims
- 1367US7089138B1Canary device for failure analysisIBM·Filed 2005·Granted Aug 8, 2006·5 cites·20 claims
- 1460US7838943B2Shared gate for conventional planar device and horizontal CNTIBM·Filed 2005·Granted Nov 23, 2010·1 cites·7 claims
- 1556US6307162B1Integrated circuit wiringIBM·Filed 1996·Granted Oct 23, 2001·22 cites·8 claims
- 1641US7109546B2Horizontal memory gain cellsIBM·Filed 2004·Granted Sep 19, 2006·2 cites·42 claims
- 1736US6251773B1Method of designing and structure for visual and electrical test of semiconductor devicesIBM·Filed 1999·Granted Jun 26, 2001·5 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →