Inventor · disambiguated record
Mostafa Maazouz
Also filed as: MAAZOUZ MOSTAFA
12 granted patents·6 pending applications·28 citations·filing 2008–2025
86Inventor score
Top patents by PatentIndex Score
18 records- 0184US10923318B2Optical alignment correction using convolutional neural network evaluation of a beam imageFEI CO·Filed 2018·Granted Feb 16, 2021·12 cites·28 claims
- 0282US8933414B2Focused ion beam low kV enhancementFEI CO·Filed 2013·Granted Jan 13, 2015·4 cites·19 claims
- 0379US9443692B2Focused ion beam low kV enhancementFEI CO·Filed 2015·Granted Sep 13, 2016·2 cites·21 claims
- 0479US8164059B2In-chamber electron detectorGERLACH ROBERT·Filed 2008·Granted Apr 24, 2012·5 cites·27 claims
- 0577US10896802B2Combined SEM-CL and FIB-IOE microscopyMAAZOUZ MOSTAFA·Filed 2018·Granted Jan 19, 2021·4 cites·23 claims
- 0675US12237142B2Methods for determining the virtual source location of a liquid metal ion sourceFEI CO·Filed 2022·Granted Feb 25, 2025·0 cites·20 claims
- 0772US2024429018A1Methods and systems for elemental mappingFEI CO·Filed 2024·Application pending·0 cites
- 0872US2025157780A1Methods for determining the virtual source location of a liquid metal ion sourceFEI CO·Filed 2025·Application pending·0 cites
- 0961US9679742B2Method for optimizing charged particle beams formed by shaped aperturesFEI CO·Filed 2015·Granted Jun 13, 2017·1 cites·16 claims
- 1060US9087672B2Focused ion beam low kV enhancementFEI CO·Filed 2014·Granted Jul 21, 2015·0 cites·23 claims
- 1160US2023095798A1Methods and systems for elemental mappingFEI CO·Filed 2021·Application pending·0 cites
- 1255US9105438B2Imaging and processing for plasma ion sourceFEI CO·Filed 2013·Granted Aug 11, 2015·0 cites·20 claims
- 1352US9691583B2Imaging and processing for plasma ion sourceFEI CO·Filed 2015·Granted Jun 27, 2017·0 cites·18 claims
- 1452US2025157779A1Minimization of energy spread in focused ion beam (fib) systemsFEI CO·Filed 2023·Application pending·0 cites
- 1550US2012199738A1In-chamber electron detectorGERLACH ROBERT·Filed 2012·Application pending·0 cites
- 1643US10692694B2Method and apparatus for enhancing SE detection in mirror-based light imaging charged particle microscopesGledhill Galen·Filed 2018·Granted Jun 23, 2020·0 cites·24 claims
- 1739US8742361B2Focused charged particle column for operation at different beam energies at a targetMAAZOUZ MOSTAFA·Filed 2012·Granted Jun 3, 2014·0 cites·18 claims
- 1833US2018061613A1Charged-particle microscope with exchangeable pole piece extending elementFEI CO·Filed 2017·Application pending·0 cites
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