Inventor · disambiguated record
Youjin Wang
Also filed as: WANG YOUJIN
7 granted patents·1 pending application·8 citations·filing 2013–2021
78Inventor score
Top patents by PatentIndex Score
8 records- 0186US10088438B2Method and system for inspecting an EUV maskHERMES MICROVISION INC·Filed 2016·Granted Oct 2, 2018·2 cites·13 claims
- 0284US10775325B2Method and system for inspecting an EUV maskASML NETHERLANDS BV·Filed 2018·Granted Sep 15, 2020·2 cites·9 claims
- 0373US9164399B2Reticle operation systemHERMES MICROVISION INC·Filed 2013·Granted Oct 20, 2015·2 cites·7 claims
- 0472US11662323B2Method and system for inspecting an EUV maskASML NETHERLANDS BV·Filed 2020·Granted May 30, 2023·0 cites·15 claims
- 0570US9485846B2Method and system for inspecting an EUV maskHERMES MICROVISION INC·Filed 2014·Granted Nov 1, 2016·1 cites·4 claims
- 0665US9859089B2Method and system for inspecting and grounding an EUV maskHERMES MICROVISION INC·Filed 2015·Granted Jan 2, 2018·1 cites·7 claims
- 0756US10643818B2Load lock system for charged particle beam imagingASML NETHERLANDS BV·Filed 2019·Granted May 5, 2020·0 cites·21 claims
- 0851US2024071713A1Dual focus soluton for sem metrology toolsASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Youjin Wang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →