Inventor · disambiguated record
Don Straney
Also filed as: STRANEY DON
3 granted patents·4 citations·filing 2014–2021
57Inventor score
Files withJENTEK SENSORS INC3
Top patents by PatentIndex Score
3 records- 0183US10324062B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2014·Granted Jun 18, 2019·4 cites·4 claims
- 0273US11959880B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2021·Granted Apr 16, 2024·0 cites·16 claims
- 0366US11092571B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2019·Granted Aug 17, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →