Inventor · disambiguated record
Greg Eilenstine
Also filed as: EILENSTINE GREG
3 granted patents·6 citations·filing 2007–2012
60Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0180US9659757B2Measuring and controlling wafer potential in pulsed RF bias processingLAM RES CORP·Filed 2012·Granted May 23, 2017·4 cites·11 claims
- 0263US8192576B2Methods of and apparatus for measuring and controlling wafer potential in pulsed RF bias processingKUTHI ANDRAS·Filed 2007·Granted Jun 5, 2012·2 cites·22 claims
- 0347US8303763B2Measuring and controlling wafer potential in pulsed RF bias processingKUTHI ANDRAS·Filed 2012·Granted Nov 6, 2012·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →