Inventor · disambiguated record
Osamu Furuhashi
Also filed as: FURUHASHI OSAMU
19 granted patents·4 pending applications·75 citations·filing 2006–2022
90Inventor score
Top patents by PatentIndex Score
23 records- 0196US7582866B2Ion trap mass spectrometrySHIMADZU CORP·Filed 2007·Granted Sep 1, 2009·44 cites·4 claims
- 0288US8772708B2Time-of-flight mass spectrometerKINUGAWA TOHRU·Filed 2011·Granted Jul 8, 2014·21 cites·20 claims
- 0368US10573504B2Orthogonal acceleration time-of-flight mass spectrometrySHIMADZU CORP·Filed 2016·Granted Feb 25, 2020·1 cites·8 claims
- 0468US9275843B2Time-of-flight mass spectrometerFURUHASHI OSAMU·Filed 2012·Granted Mar 1, 2016·2 cites·14 claims
- 0566US12198920B2Ion analyzerSHIMADZU CORP·Filed 2022·Granted Jan 14, 2025·0 cites·10 claims
- 0666US10923339B2Orthogonal acceleration time-of-flight mass spectrometrySHIMADZU CORP·Filed 2020·Granted Feb 16, 2021·0 cites·9 claims
- 0766US7759640B2Mass spectrometerSHIMADZU CORP·Filed 2006·Granted Jul 20, 2010·2 cites·13 claims
- 0865US8612162B2Mass analysis data processing method and mass spectrometerFURUHASHI OSAMU·Filed 2011·Granted Dec 17, 2013·2 cites·9 claims
- 0964US9613787B2Time-of-flight mass spectrometer for conducting high resolution mass analysisFURUHASHI OSAMU·Filed 2008·Granted Apr 4, 2017·1 cites·12 claims
- 1063US11906449B2Mass spectrometerSHIMADZU CORP·Filed 2021·Granted Feb 20, 2024·0 cites·13 claims
- 1162US8097844B2Mass-analysis method and mass-analysis apparatusFURUHASHI OSAMU·Filed 2006·Granted Jan 17, 2012·1 cites·7 claims
- 1260US10930488B2Mass spectrometer, sampling probe, and analysis methodSHIMADZU CORP·Filed 2020·Granted Feb 23, 2021·0 cites·11 claims
- 1359US2025020603A1Surface Analysis Method and Surface Analysis ApparatusSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 1457US8492711B2Multi-turn time-of-flight mass spectrometerKINUGAWA TOHRU·Filed 2011·Granted Jul 23, 2013·1 cites·11 claims
- 1553US7550716B2Mass spectrometerSHIMADZU CORP·Filed 2006·Granted Jun 23, 2009·0 cites·10 claims
- 1652US2009230301A1Mass spectrometry apparatus and methodSHIMADZU CORP·Filed 2009·Application pending·0 cites
- 1751US2011168883A1Mass spectrometerSHIMADZU CORP·Filed 2008·Application pending·0 cites
- 1848US10186413B2Time-of-flight mass spectrometerSHIMADZU CORP·Filed 2014·Granted Jan 22, 2019·0 cites·6 claims
- 1948US9048082B2Time-of-flight mass spectrometerFURUHASHI OSAMU·Filed 2012·Granted Jun 2, 2015·0 cites·20 claims
- 2047US9490114B2Time-of-flight mass spectrometerSHIMADZU CORP·Filed 2013·Granted Nov 8, 2016·0 cites·11 claims
- 2147US2020266046A1Mass spectrometerSHIMADZU CORP·Filed 2020·Application pending·0 cites
- 2242US9892902B2Ion radiation device and surface analyzer using said deviceSHIMADZU CORP·Filed 2016·Granted Feb 13, 2018·0 cites·13 claims
- 2341US10529549B2Method for analyzing optical isomers using circularly polarized light and ion mobility analyzerSHIMADZU CORP·Filed 2018·Granted Jan 7, 2020·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →