Inventor · disambiguated record
Chun-Deuk Lee
Also filed as: LEE CHUN-DEUK
7 granted patents·51 citations·filing 1998–2009
83Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7
Top patents by PatentIndex Score
7 records- 0175US7851372B2Composition for removing an insulation material, method of removing an insulation layer and method of recycling a substrate using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 14, 2010·5 cites·14 claims
- 0269US7566666B2Composition for removing an insulation material and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 28, 2009·3 cites·8 claims
- 0355US6159646ARework method utilizing thinner for wafers in manufacturing of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Dec 12, 2000·23 cites·14 claims
- 0454US7842623B2Composition for removing an insulation material and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Nov 30, 2010·0 cites·20 claims
- 0539US6207358B1Method of stripping a photoresist from a semiconductor substrate using dimethylacetamide or a combination of monoethanolamine and dimethylsulfoxideSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 27, 2001·8 cites·11 claims
- 0635US6337174B1Method of stripping a photoresist from a semiconductor substrate dimethylacetamide or a combination of monoethanolamine and dimethylsulfoxideSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 8, 2002·4 cites·23 claims
- 0734US6010637AMethod and apparatus for preparing a sample for optical analysis and method of controlling the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jan 4, 2000·8 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →