Inventor · disambiguated record
Johan De Greeve
Also filed as: DE GREEVE JOHAN
7 granted patents·15 citations·filing 2011–2020
76Inventor score
Top patents by PatentIndex Score
7 records- 0194US10634487B2Method and system for optical three dimensional topography measurementKLA TENCOR CORP·Filed 2016·Granted Apr 28, 2020·11 cites·10 claims
- 0274US9886764B2Image acquisition system, image acquisition method, and inspection systemKLA TENCOR CORP·Filed 2015·Granted Feb 6, 2018·2 cites·35 claims
- 0364US11287248B2Method and system for optical three dimensional topography measurementKLA TENCOR CORP·Filed 2020·Granted Mar 29, 2022·0 cites·9 claims
- 0446US9255893B2Apparatus for illuminating substrates in order to image micro cracks, pinholes and inclusions in monocrystalline and polycrystalline substrates and method thereforeGRZEGORCZYK WOJCIECH·Filed 2011·Granted Feb 9, 2016·2 cites·26 claims
- 0544US10866092B2Chromatic confocal area sensorKLA TENCOR CORP·Filed 2019·Granted Dec 15, 2020·0 cites·18 claims
- 0630US10215560B2Method for shape classification of an objectKLA TENCOR CORP·Filed 2015·Granted Feb 26, 2019·0 cites·15 claims
- 0722US8830454B2Apparatus and methods for setting up optical inspection parametersDE GREEVE JOHAN·Filed 2011·Granted Sep 9, 2014·0 cites·18 claims
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