Inventor · disambiguated record
Piotr Edelman
Also filed as: EDELMAN PIOTR
5 granted patents·1 pending application·308 citations·filing 1994–2018
85Inventor score
Files withSEMICONDUCTOR DIAGNOSTICS INC3UNIV SOUTH FLORIDA2SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD1
Top patents by PatentIndex Score
6 records- 0190US7202691B2Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafersSEMICONDUCTOR DIAGNOSTICS INC·Filed 2005·Granted Apr 10, 2007·32 cites·18 claims
- 0290US6037797AMeasurement of the interface trap charge in an oxide semiconductor layer interfaceSEMICONDUCTOR DIAGNOSTICS INC·Filed 1997·Granted Mar 14, 2000·85 cites·20 claims
- 0389US5773989AMeasurement of the mobile ion concentration in the oxide layer of a semiconductor waferUNIV SOUTH FLORIDA·Filed 1995·Granted Jun 30, 1998·130 cites·24 claims
- 0466US5663657ADetermining long minority carrier diffusion lengthsUNIV SOUTH FLORIDA·Filed 1994·Granted Sep 2, 1997·48 cites·30 claims
- 0560US6771091B2Method and system for elevated temperature measurement with probes designed for room temperature measurementSEMICONDUCTOR DIAGNOSTICS INC·Filed 2002·Granted Aug 3, 2004·13 cites·20 claims
- 0635US2018315630A1Charge Metrology for Integrated MeasurementSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →