Inventor · disambiguated record
Yi Jin Kwon
Also filed as: KWON YI JIN
11 granted patents·54 citations·filing 2002–2018
87Inventor score
Files withSEMICONDUCTOR MFG INT SHANGHAI CORP5HYNIX SEMICONDUCTOR INC3MACRONIX INT CO LTD2HYNIX SEMICONDUCTOR1
Top patents by PatentIndex Score
11 records- 0186US10382040B2High voltage level shifting (HVLS) circuit and related semiconductor devicesSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2018·Granted Aug 13, 2019·7 cites·16 claims
- 0275US6865116B2Clamp circuit and boosting circuit using the sameHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Mar 8, 2005·24 cites·13 claims
- 0365US9570115B2Memory device, related method, and related electronic deviceSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2015·Granted Feb 14, 2017·2 cites·9 claims
- 0462US9768778B2High voltage level shifter in ultra low power supply memory applicationSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2016·Granted Sep 19, 2017·1 cites·15 claims
- 0550US8045390B2Memory system with dynamic reference cell and method of operating the sameMACRONIX INT CO LTD·Filed 2008·Granted Oct 25, 2011·2 cites·10 claims
- 0650US7881121B2Decoding method in an NROM flash memory arrayMACRONIX INT CO LTD·Filed 2006·Granted Feb 1, 2011·2 cites·8 claims
- 0750US6865118B2Boosting circuit in semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Mar 8, 2005·7 cites·8 claims
- 0847US6724245B2Boosting circuitHYNIX SEMICONDUCTOR·Filed 2002·Granted Apr 20, 2004·5 cites·15 claims
- 0945US7015743B2Circuit of redundancy IO fuse in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Mar 21, 2006·4 cites·4 claims
- 1041US9953689B2Memory device, related method, and related electronic deviceSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2016·Granted Apr 24, 2018·0 cites·9 claims
- 1131US10410727B2Non-volatile memories and data reading methods thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2017·Granted Sep 10, 2019·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →