Inventor · disambiguated record
Leah Pastel
Also filed as: PASTEL LEAH M · PASTEL LEAH M P · PASTEL LEAH M PFEIFER · PASTEL LEAH MARIE P
41 granted patents·2 pending applications·386 citations·filing 2001–2015
98Inventor score
Top patents by PatentIndex Score
43 records- 0192US7139950B2Segmented scan chains with dynamic reconfigurationsIBM·Filed 2004·Granted Nov 21, 2006·58 cites·17 claims
- 0289US8136082B2Method for testing integrated circuitsDESINENI RAO H·Filed 2011·Granted Mar 13, 2012·9 cites·16 claims
- 0388US7240261B2Scan chain diagnostics using logic pathsIBM·Filed 2003·Granted Jul 3, 2007·19 cites·15 claims
- 0487US7484423B2Integrated carbon nanotube sensorsIBM·Filed 2007·Granted Feb 3, 2009·12 cites·19 claims
- 0586US7971176B2Method for testing integrated circuitsIBM·Filed 2008·Granted Jun 28, 2011·13 cites·10 claims
- 0683US6880136B2Method to detect systematic defects in VLSI manufacturingIBM·Filed 2002·Granted Apr 12, 2005·29 cites·22 claims
- 0782US7895487B2Scan chain diagnostics using logic pathsIBM·Filed 2007·Granted Feb 22, 2011·9 cites·16 claims
- 0882US6901542B2Internal cache for on chip test data storageIBM·Filed 2001·Granted May 31, 2005·35 cites·33 claims
- 0981US7247877B2Integrated carbon nanotube sensorsIBM·Filed 2004·Granted Jul 24, 2007·24 cites·15 claims
- 1080US7194706B2Designing scan chains with specific parameter sensitivities to identify process defectsIBM·Filed 2004·Granted Mar 20, 2007·24 cites·26 claims
- 1179US6671644B2Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collectionIBM·Filed 2001·Granted Dec 30, 2003·15 cites·22 claims
- 1278US7596736B2Iterative process for identifying systematics in dataIBM·Filed 2006·Granted Sep 29, 2009·9 cites·20 claims
- 1376US7202689B2Sensor differentiated fault isolationIBM·Filed 2005·Granted Apr 10, 2007·8 cites·14 claims
- 1472US7895545B2Methods for designing a product chip a priori for design subsetting, feature analysis, and yield learningIBM·Filed 2008·Granted Feb 22, 2011·5 cites·8 claims
- 1570US9059230B1Lateral silicon-on-insulator bipolar junction transistor process and structureIBM·Filed 2014·Granted Jun 16, 2015·2 cites·10 claims
- 1670US7853848B2System and method for signature-based systematic condition detection and analysisIBM·Filed 2007·Granted Dec 14, 2010·6 cites·18 claims
- 1770US6998866B1Circuit and method for monitoring defectsIBM·Filed 2004·Granted Feb 14, 2006·13 cites·30 claims
- 1869US7397263B2Sensor differentiated fault isolationIBM·Filed 2007·Granted Jul 8, 2008·5 cites·20 claims
- 1969US7007214B2Diagnosable scan chainIBM·Filed 2003·Granted Feb 28, 2006·14 cites·29 claims
- 2068US7285860B2Method and structure for defect monitoring of semiconductor devices using power bus wiring gridsIBM·Filed 2006·Granted Oct 23, 2007·2 cites·3 claims
- 2167US8566059B2Insertion of faults in logic model used in simulationDESINENI RAO H·Filed 2009·Granted Oct 22, 2013·4 cites·25 claims
- 2267US7434130B2Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collectionIBM·Filed 2004·Granted Oct 7, 2008·8 cites·3 claims
- 2367US7089138B1Canary device for failure analysisIBM·Filed 2005·Granted Aug 8, 2006·5 cites·20 claims
- 2466US9397203B2Lateral silicon-on-insulator bipolar junction transistor process and structureGLOBALFOUNDRIES INC·Filed 2015·Granted Jul 19, 2016·1 cites·9 claims
- 2566US7093213B2Method for designing an integrated circuit defect monitorIBM·Filed 2004·Granted Aug 15, 2006·11 cites·20 claims
- 2666US7088124B2Utilizing clock shield as defect monitorIBM·Filed 2005·Granted Aug 8, 2006·3 cites·7 claims
- 2763US7005874B2Utilizing clock shield as defect monitorIBM·Filed 2004·Granted Feb 28, 2006·7 cites·14 claims
- 2860US6677774B2Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic testerIBM·Filed 2001·Granted Jan 13, 2004·8 cites·6 claims
- 2959US7898045B2Passive electrically testable acceleration and voltage measurement devicesIBM·Filed 2008·Granted Mar 1, 2011·2 cites·13 claims
- 3058US7428675B2Testing using independently controllable voltage islandsIBM·Filed 2003·Granted Sep 23, 2008·5 cites·18 claims
- 3158US6675323B2Incremental fault dictionaryIBM·Filed 2001·Granted Jan 6, 2004·8 cites·7 claims
- 3254US7064570B2Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic testerIBM·Filed 2003·Granted Jun 20, 2006·5 cites·19 claims
- 3353US7078248B2Method and structure for defect monitoring of semiconductor devices using power bus wiring gridsIBM·Filed 2004·Granted Jul 18, 2006·3 cites·8 claims
- 3453US6566681B2Apparatus for assisting backside focused ion beam device modificationIBM·Filed 2001·Granted May 20, 2003·2 cites·8 claims
- 3553US2008284459A1Testing Using Independently Controllable Voltage IslandsIBM·Filed 2008·Application pending·0 cites
- 3652US8571299B2Identifying defectsFAYAZ MOHAMMED F·Filed 2010·Granted Oct 29, 2013·1 cites·18 claims
- 3751US7629192B2Passive electrically testable acceleration and voltage measurement devicesIBM·Filed 2005·Granted Dec 8, 2009·0 cites·10 claims
- 3846US7230335B2Inspection methods and structures for visualizing and/or detecting specific chip structuresIBM·Filed 2004·Granted Jun 12, 2007·1 cites·3 claims
- 3945US9244946B2Data mining shape based dataIBM·Filed 2012·Granted Jan 26, 2016·0 cites·12 claims
- 4045US9235601B2Data mining shape based dataIBM·Filed 2013·Granted Jan 12, 2016·0 cites·6 claims
- 4144US7239167B2Utilizing clock shield as defect monitorIBM·Filed 2006·Granted Jul 3, 2007·0 cites·20 claims
- 4238US7089514B2Defect diagnosis for semiconductor integrated circuitsIBM·Filed 2004·Granted Aug 8, 2006·1 cites·20 claims
- 4336US2008129324A1Hot Switchable Voltage Bus for Iddq Current MeasurementsIBM·Filed 2003·Application pending·0 cites
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