Inventor · disambiguated record
Tie Jiang Wu
Also filed as: WU TIE · WU TIE-JIANG
15 granted patents·2 pending applications·79 citations·filing 2003–2014
92Inventor score
Top patents by PatentIndex Score
17 records- 0176US7217581B2Misalignment test structure and method thereofNANYA TECHNOLOGY CORP·Filed 2006·Granted May 15, 2007·4 cites·8 claims
- 0270US7026647B2Device and method for detecting alignment of active areas and memory cell structures in DRAM devicesNANYA TECHNOLOGY CORP·Filed 2003·Granted Apr 11, 2006·11 cites·4 claims
- 0370US6693834B1Device and method for detecting alignment of bit lines and bit line contacts in DRAM devicesNANYA TECHNOLOGY CORP·Filed 2003·Granted Feb 17, 2004·13 cites·15 claims
- 0469US6902942B2Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devicesNANYA TECHNOLOGY CORP·Filed 2003·Granted Jun 7, 2005·12 cites·12 claims
- 0567US7381575B2Device and method for detecting alignment of active areas and memory cell structures in DRAM devicesNANYA TECHNOLOGY CORP·Filed 2005·Granted Jun 3, 2008·2 cites·3 claims
- 0667US6891216B1Test structure of DRAMNANYA TECHNOLOGY CORP·Filed 2003·Granted May 10, 2005·11 cites·13 claims
- 0756US6946678B2Test key for validating the position of a word line overlaying a trench capacitor in DRAMsNANYA TECHNOLOGY CORP·Filed 2004·Granted Sep 20, 2005·4 cites·5 claims
- 0856US6801462B2Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devicesNANYA TECHNOLOGY CORP·Filed 2003·Granted Oct 5, 2004·5 cites·9 claims
- 0952US6838296B2Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devicesNANYA TECHNOLOGY CORP·Filed 2003·Granted Jan 4, 2005·3 cites·10 claims
- 1052US6812487B1Test key and method for validating the doping concentration of buried layers within a deep trench capacitorsNANYA TECHNOLOGY CORP·Filed 2003·Granted Nov 2, 2004·4 cites·8 claims
- 1151US7015050B2Misalignment test structure and method thereofNANYA TECHONOLGY CORP·Filed 2003·Granted Mar 21, 2006·4 cites·12 claims
- 1248US6788598B2Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereofNANYA TECHNOLOGY CORP·Filed 2003·Granted Sep 7, 2004·3 cites·8 claims
- 1341US6984534B2Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normalNANYA TECHNOLOGY CORP·Filed 2004·Granted Jan 10, 2006·2 cites·7 claims
- 1441US6825053B2Test key and method for validating the position of a word line overlaying a trench capacitor in DRAMSNANYA TECHNOLOGY CORP·Filed 2003·Granted Nov 30, 2004·0 cites·5 claims
- 1541US2014341582A1Systems and methods for single wavelength with dual channels for control signal and internet data transmissionUNIV NORTH CAROLINA STATE·Filed 2014·Application pending·0 cites
- 1637US6844207B2Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normalNANYA TECHNOLOGY CORP·Filed 2003·Granted Jan 18, 2005·1 cites·3 claims
- 1735US2004241954A1Method for forming a crown capacitorNANYA TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →