Inventor · disambiguated record
Takeo Kamino
Also filed as: KAMINO TAKEO
7 granted patents·2 pending applications·145 citations·filing 1993–2010
87Inventor score
Files withHITACHI HIGH TECH CORP3HITACHI LTD3HITACHI SCIENCE SYSTEMS LTD1WATANABE MASAHIRO1YAGUCHI TOSHIE1
Top patents by PatentIndex Score
9 records- 0194US7612337B2Focused ion beam system and a method of sample preparation and observationHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 3, 2009·30 cites·10 claims
- 0288US6495838B1Sample heating holder, method of observing a sample and charged particle beam apparatusHITACHI LTD·Filed 1999·Granted Dec 17, 2002·57 cites·12 claims
- 0382US8604429B2Electron beam device and sample holding device for electron beam deviceYAGUCHI TOSHIE·Filed 2010·Granted Dec 10, 2013·7 cites·12 claims
- 0479US7622714B2Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 24, 2009·6 cites·15 claims
- 0574US6992286B2Material characterization systemHITACHI SCIENCE SYSTEMS LTD·Filed 2004·Granted Jan 31, 2006·11 cites·13 claims
- 0668US5898177AElectron microscopeHITACHI LTD·Filed 1997·Granted Apr 27, 1999·20 cites·8 claims
- 0753US5296669ASpecimen heating device for use with an electron microscopeHITACHI LTD·Filed 1993·Granted Mar 22, 1994·14 cites·7 claims
- 0849US2008093565A1Charged particle beam system and its specimen holderHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 0944US2012295184A1High-potential stable oxide support for polymer electrolyte fuel cellWATANABE MASAHIRO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →