Inventor · disambiguated record
Tomoyasu Shojo
Also filed as: SHOJO TOMOYASU
17 granted patents·2 pending applications·67 citations·filing 2007–2018
92Inventor score
Top patents by PatentIndex Score
19 records- 0192US8841612B2Charged particle beam microscopeFUKUDA MUNEYUKI·Filed 2011·Granted Sep 23, 2014·12 cites·5 claims
- 0288US7557347B2Charged particle beam apparatus, scanning electron microscope, and sample observation method using the sameHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 7, 2009·11 cites·19 claims
- 0387US8389935B2Charged particle beam apparatus permitting high-resolution and high-contrast observationFUKUDA MUNEYUKI·Filed 2009·Granted Mar 5, 2013·7 cites·12 claims
- 0486US7875849B2Electron beam apparatus and electron beam inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jan 25, 2011·7 cites·12 claims
- 0584US8431915B2Charged particle beam apparatus permitting high resolution and high-contrast observationFUKUDA MUNEYUKI·Filed 2012·Granted Apr 30, 2013·4 cites·13 claims
- 0682US8431893B2Electron beam apparatus and electron beam inspection methodFUKUDA MUNEYUKI·Filed 2012·Granted Apr 30, 2013·4 cites·2 claims
- 0782US8026481B2Charged particle apparatus, scanning electron microscope, and sample inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 27, 2011·6 cites·7 claims
- 0881US8207498B2Electron beam apparatus and electron beam inspection methodFUKUDA MUNEYUKI·Filed 2011·Granted Jun 26, 2012·4 cites·2 claims
- 0978US10121632B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 6, 2018·2 cites·13 claims
- 1077US8785890B2Charged particle beam apparatus permitting high-resolution and high-contrast observationHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·2 cites·13 claims
- 1171US9159533B2Charged particle beam apparatus permitting high-resolution and high-contrast observationHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 13, 2015·1 cites·15 claims
- 1268US8467595B2Defect review system and method, and programTAKAHASHI NORITSUGU·Filed 2009·Granted Jun 18, 2013·4 cites·5 claims
- 1366US9799483B2Charged particle beam device and detection method using said deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 24, 2017·1 cites·15 claims
- 1464US8405026B2Charged particle beam apparatusSHOJO TOMOYASU·Filed 2009·Granted Mar 26, 2013·2 cites·3 claims
- 1557US8859962B2Charged-particle microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 14, 2014·0 cites·7 claims
- 1651US11211224B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Dec 28, 2021·0 cites·12 claims
- 1751US2012004879A1Charged particle apparatus, scanning electron microscope, and sample inspection methodFUKUDA MUNEYUKI·Filed 2011·Application pending·0 cites
- 1847US9384940B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 5, 2016·0 cites·15 claims
- 1943US2012119087A1Charged-particle microscopeTAKAHASHI NORITSUGU·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Tomoyasu Shojo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →