Inventor · disambiguated record
Sean Lian
Also filed as: LIAN SEAN
10 granted patents·1 pending application·26 citations·filing 2003–2017
84Inventor score
Top patents by PatentIndex Score
11 records- 0178US10186599B1Forming self-aligned contact with spacer firstIBM·Filed 2017·Granted Jan 22, 2019·2 cites·17 claims
- 0275US9653571B2Freestanding spacer having sub-lithographic lateral dimension and method of forming sameIBM·Filed 2015·Granted May 16, 2017·2 cites·20 claims
- 0363US6987052B2Method for making enhanced substrate contact for a semiconductor deviceAGERE SYSTEMS INC·Filed 2003·Granted Jan 17, 2006·12 cites·16 claims
- 0458US7329605B2Semiconductor structure formed using a sacrificial structureAGERE SYSTEMS INC·Filed 2005·Granted Feb 12, 2008·1 cites·9 claims
- 0557US8188550B2Integrated circuit structure with electrical strap and its method of formingYANG LIEYONG·Filed 2008·Granted May 29, 2012·5 cites·21 claims
- 0651US7741702B2Semiconductor structure formed using a sacrificial structureAGERE SYSTEMS INC·Filed 2007·Granted Jun 22, 2010·0 cites·20 claims
- 0750US7339274B2Metallization performance in electronic devicesAGERE SYSTEMS INC·Filed 2004·Granted Mar 4, 2008·4 cites·27 claims
- 0847US7705473B2Methods and apparatus for determining pad height for a wire-bonding operation in an integrated circuitAGERE SYSTEMS INC·Filed 2006·Granted Apr 27, 2010·0 cites·13 claims
- 0940US2009081814A1Integrated manufacturing system with transistor drive current controlCHARTERED SEMICONDUCTOR MFG·Filed 2007·Application pending·0 cites
- 1039US7056819B2Methods and apparatus for determining pad height for a wire-bonding operation in an integrated circuitAGERE SYSTEMS INC·Filed 2003·Granted Jun 6, 2006·0 cites·19 claims
- 1138US6919228B2Methods and apparatus for the detection of damaged regions on dielectric film or other portions of a dieAGERE SYSTEMS INC·Filed 2003·Granted Jul 19, 2005·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →