Inventor · disambiguated record
Kazuo Kawamura
Also filed as: KAWAMURA KAZUO
28 granted patents·8 pending applications·681 citations·filing 1975–2012
97Inventor score
Files withFUJITSU LTD9FUJI PHOTO FILM CO LTD5AKIYAMA SHINICHI4FUJITSU MICROELECTRONICS LTD3FUJITSU SEMICONDUCTOR LTD3
Top patents by PatentIndex Score
36 records- 0195US7649232B2P-channel MOS transistor, semiconductor integrated circuit device and fabrication process thereofFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Jan 19, 2010·37 cites·13 claims
- 0295US7390707B2Semiconductor device fabrication methodFUJITSU LTD·Filed 2005·Granted Jun 24, 2008·31 cites·13 claims
- 0391US6563537B1Image signal interpolationFUJI PHOTO FILM CO LTD·Filed 1998·Granted May 13, 2003·252 cites·34 claims
- 0490US4145468AComposite fabric comprising a non-woven fabric bonded to woven or knitted fabricASAHI CHEMICAL IND·Filed 1977·Granted Mar 20, 1979·124 cites·15 claims
- 0589US4359178AWeb infeed tension control system with dancer rollKOMORI PRINTING MACH·Filed 1980·Granted Nov 16, 1982·35 cites·7 claims
- 0683US8076239B2Semiconductor device and method of manufacturing the sameKAWAMURA KAZUO·Filed 2008·Granted Dec 13, 2011·16 cites·15 claims
- 0782US7407888B2Semiconductor device and a fabrication process thereofFUJITSU LTD·Filed 2006·Granted Aug 5, 2008·10 cites·11 claims
- 0881US5075575AExternally synchronized programmable deviceFUJI PHOTO FILM CO LTD·Filed 1990·Granted Dec 24, 1991·47 cites·10 claims
- 0980US7557446B2Semiconductor device and a fabrication process thereofFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Jul 7, 2009·8 cites·3 claims
- 1080US7432180B2Method of fabricating a nickel silicide layer by conducting a thermal annealing process in a silane gasFUJITSU LTD·Filed 2006·Granted Oct 7, 2008·7 cites·14 claims
- 1175US6060590AChitinase related proteins and methods of useUNIV CALIFORNIA·Filed 1998·Granted May 9, 2000·28 cites·1 claims
- 1274US7829461B2Method for fabricating semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Nov 9, 2010·4 cites·13 claims
- 1373US8338953B2Method of manufacturing a semiconductor device and semiconductor deviceAKIYAMA SHINICHI·Filed 2011·Granted Dec 25, 2012·2 cites·4 claims
- 1471US4782393ATelevision camera system with a protection function for a misconnectionTOSHIBA KK·Filed 1987·Granted Nov 1, 1988·24 cites·11 claims
- 1566US8679973B2Method of manufacturing semiconductor deviceAKIYAMA SHINICHI·Filed 2007·Granted Mar 25, 2014·2 cites·7 claims
- 1664US8030207B2Method of manufacturing a semiconductor device and semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Oct 4, 2011·1 cites·10 claims
- 1762US7977194B2Method for fabricating semiconductor device with fully silicided gate electrodeFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Jul 12, 2011·3 cites·13 claims
- 1855US8536708B2Method of manufacturing a semiconductor device and semiconductor deviceAKIYAMA SHINICHI·Filed 2012·Granted Sep 17, 2013·0 cites·8 claims
- 1955US7329604B2Semiconductor device and method for fabricating the sameFUJTISU LTD·Filed 2005·Granted Feb 12, 2008·1 cites·18 claims
- 2054US2010165179A1Imaging apparatus and imaging methodFUJIFILM CORP·Filed 2009·Application pending·0 cites
- 2148US4036694AProcess for beet sugar productionHOKKAIDO SUGAR CO·Filed 1975·Granted Jul 19, 1977·6 cites·6 claims
- 2248US2007018255A1Semiconductor device and method for fabricating the sameFUJITSU LTD·Filed 2006·Application pending·0 cites
- 2347US2012171864A1Method of manufacturing semiconductor deviceAKIYAMA SHINICHI·Filed 2012·Application pending·0 cites
- 2446US4300168ATelevision camera deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1980·Granted Nov 10, 1981·7 cites·4 claims
- 2544US7429525B2Fabrication process of a semiconductor deviceFUJITSU LTD·Filed 2006·Granted Sep 30, 2008·0 cites·15 claims
- 2644US2007202695A1Method for fabricating a semiconductor deviceFUJITSU LTD·Filed 2006·Application pending·0 cites
- 2743US2009075477A1Method of manufacturing semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2008·Application pending·0 cites
- 2843US2009032844A1Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2008·Application pending·0 cites
- 2942US2005253205A1Semiconductor device and method for fabricating the sameFUJITSU LTD·Filed 2004·Application pending·0 cites
- 3041US5641357AApparatus for checking glue application stateNIRECO CORP·Filed 1995·Granted Jun 24, 1997·10 cites·5 claims
- 3140US2006079087A1Method of producing semiconductor deviceFUJITSU LTD·Filed 2005·Application pending·0 cites
- 3239US5357310ACorrelation phase difference type focus detecting interpolationFUJI PHOTO FILM CO LTD·Filed 1994·Granted Oct 18, 1994·8 cites·12 claims
- 3337US5208672AHorizontal synchronizing signal generating circuitFUJI PHOTO FILM CO LTD·Filed 1991·Granted May 4, 1993·6 cites·8 claims
- 3436US5568249APhase difference detection type rangefinder and method of measuring subject distanceFUJI PHOTO FILM CO LTD·Filed 1994·Granted Oct 22, 1996·7 cites·12 claims
- 3526US5472520AMethod of controlling oxygen deposition during decarbutization annealing on steel sheetsKAWASAKI STEEL CO·Filed 1994·Granted Dec 5, 1995·2 cites·12 claims
- 3626US4318131ATV Camera system having synchronized oscillators in camera head and CCUTOKYO SHIBAURA ELECTRIC CO·Filed 1980·Granted Mar 2, 1982·3 cites·9 claims
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