Inventor · disambiguated record
Yeh-Sen Lin
Also filed as: LIN YEH-SEN
9 granted patents·187 citations·filing 1996–1999
90Inventor score
Files withVANGUARD INT SEMICONDUCT CORP9
Top patents by PatentIndex Score
9 records- 0186US5780339AMethod for fabricating a semiconductor memory cell in a DRAMVANGUARD INT SEMICONDUCT CORP·Filed 1997·Granted Jul 14, 1998·60 cites·18 claims
- 0268US6004853AMethod to improve uniformity and the critical dimensions of a DRAM gate structureVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Dec 21, 1999·37 cites·23 claims
- 0359US5770510AMethod for manufacturing a capacitor using non-conformal dielectricVANGUARD INT SEMICONDUCT CORP·Filed 1996·Granted Jun 23, 1998·20 cites·25 claims
- 0451US6329252B1Method of forming self-aligned contactsVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Dec 11, 2001·18 cites·20 claims
- 0551US5668039AMethod for forming crown-shape capacitor node with tapered etchingVANGUARD INT SEMICONDUCT CORP·Filed 1996·Granted Sep 16, 1997·14 cites·25 claims
- 0646US6251742B1Method of manufacturing a cup-shape capacitorVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Jun 26, 2001·14 cites·20 claims
- 0743US5597764AMethod of contact formation and planarization for semiconductor processesVANGUARD INT SEMICONDUCT CORP·Filed 1996·Granted Jan 28, 1997·11 cites·25 claims
- 0839US6309968B1Method to improve intrinsic refresh time and dichlorosilane formed gate oxide reliabilityVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Oct 30, 2001·8 cites·6 claims
- 0936US6207491B1Method for preventing silicon substrate loss in fabricating semiconductor deviceVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Mar 27, 2001·5 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →