Inventor · disambiguated record
Purakh Raj Verma
Also filed as: VERMA PURAKH · VERMA PURAKH R · VERMA PURAKH RAJ
144 granted patents·24 pending applications·597 citations·filing 1997–2025
99Inventor score
Files withUNITED MICROELECTRONICS CORP71GLOBALFOUNDRIES SG PTE LTD39CHARTERED SEMICONDUCTOR MFG35ZHANG GUOWEI6VERMA PURAKH RAJ5
Top patents by PatentIndex Score
168 records- 0197US11205609B2Semiconductor structure with an air gapUNITED MICROELECTRONICS CORP·Filed 2020·Granted Dec 21, 2021·7 cites·13 claims
- 0297US11205605B2Semiconductor structure with back gate and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Dec 21, 2021·5 cites·12 claims
- 0397US10460980B2Semiconductor device comprising a deep trench isolation structure and a trap rich isolation structure in a substrate and a method of making the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Oct 29, 2019·17 cites·8 claims
- 0496US11127700B1Integrated circuit deviceUNITED MICROELECTRONICS CORP·Filed 2020·Granted Sep 21, 2021·4 cites·29 claims
- 0596US9472512B1Integrated circuits with contacts through a buried oxide layer and methods of producing the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Oct 18, 2016·29 cites·20 claims
- 0694US9048371B2Semiconductor devices including avalanche photodetector diodes integrated on waveguides and methods for fabricating the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Jun 2, 2015·24 cites·17 claims
- 0793US9673084B2Isolation scheme for high voltage deviceGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Jun 6, 2017·13 cites·22 claims
- 0892US7846805B2Self-aligned vertical PNP transistor for high performance SiGe CBiCMOS processCHARTERED SEMICONDUCTOR MFG·Filed 2009·Granted Dec 7, 2010·19 cites·38 claims
- 0991US8822291B2High voltage deviceZHANG GUOWEI·Filed 2012·Granted Sep 2, 2014·12 cites·18 claims
- 1090US11476363B2Semiconductor device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Oct 18, 2022·2 cites·12 claims
- 1190US9721969B2Creation of wide band gap material for integration to SOI thereofGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Aug 1, 2017·6 cites·20 claims
- 1289US12191195B2Method of fabricating an air gapUNITED MICROELECTRONICS CORP·Filed 2021·Granted Jan 7, 2025·2 cites·18 claims
- 1389US7488662B2Self-aligned vertical PNP transistor for high performance SiGe CBiCMOS processCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Feb 10, 2009·15 cites·14 claims
- 1488US11133270B1Integrated circuit device and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2020·Granted Sep 28, 2021·2 cites·15 claims
- 1588US7824968B2LDMOS using a combination of enhanced dielectric stress layer and dummy gatesCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted Nov 2, 2010·14 cites·44 claims
- 1687US11670567B2Semiconductor structure and method of wafer bondingUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jun 6, 2023·2 cites·20 claims
- 1787US9213137B2Semiconductor devices including photodetectors integrated on waveguides and methods for fabricating the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Dec 15, 2015·6 cites·13 claims
- 1887US9064894B2Stress enhanced high voltage deviceZHANG GUOWEI·Filed 2012·Granted Jun 23, 2015·8 cites·22 claims
- 1987US8790966B2High voltage deviceZHANG GUOWEI·Filed 2011·Granted Jul 29, 2014·8 cites·20 claims
- 2086US8637370B2Integration of trench MOS with low voltage integrated circuitsVERMA PURAKH RAJ·Filed 2012·Granted Jan 28, 2014·13 cites·8 claims
- 2185US10636892B2Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 28, 2020·3 cites·18 claims
- 2285US9997393B1Methods for fabricating integrated circuits including substrate contactsGLOBALFOUNDRIES SG PTE LTD·Filed 2017·Granted Jun 12, 2018·6 cites·19 claims
- 2385US8288235B2Self-aligned body fully isolated deviceVERMA PURAKH RAJ·Filed 2010·Granted Oct 16, 2012·6 cites·20 claims
- 2484US11448318B2Seal ring structureUNITED MICROELECTRONICS CORP·Filed 2020·Granted Sep 20, 2022·2 cites·14 claims
- 2584US9087906B2Grounding of silicon-on-insulator structureGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Jul 21, 2015·6 cites·23 claims
- 2684US8809150B2MOS with recessed lightly-doped drainZHANG GUOWEI·Filed 2012·Granted Aug 19, 2014·5 cites·15 claims
- 2783US10923599B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2019·Granted Feb 16, 2021·3 cites·20 claims
- 2882US10411110B1Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Sep 10, 2019·3 cites·19 claims
- 2982US8222130B2High voltage deviceZHANG GUOWEI·Filed 2009·Granted Jul 17, 2012·6 cites·18 claims
- 3082US6638844B1Method of reducing substrate coupling/noise for radio frequency CMOS (RFCMOS) components in semiconductor technology by backside trench and fillCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Oct 28, 2003·29 cites·70 claims
- 3181US11152485B2Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2020·Granted Oct 19, 2021·1 cites·30 claims
- 3281US9570545B2High voltage trench transistorGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Feb 14, 2017·4 cites·20 claims
- 3380US9842903B2Integrated circuits with laterally diffused metal oxide semiconductor structures and methods for fabricating the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Dec 12, 2017·6 cites·15 claims
- 3480US6249031B1High gain lateral PNP and NPN bipolar transistor and process compatible with CMOS for making BiCMOS circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jun 19, 2001·30 cites·5 claims
- 3580US2025379203A1Bonded semiconductor structure and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 3679US9105502B2Integrated circuit comprising on-chip resistors with plurality of first and second terminals coupled to the resistor bodyGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Aug 11, 2015·7 cites·23 claims
- 3777US12087712B2Method for fabricating an integrated circuit deviceUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 10, 2024·0 cites·14 claims
- 3877US10529854B1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 7, 2020·3 cites·20 claims
- 3976US11658118B2Transistor structure in low noise amplifierUNITED MICROELECTRONICS CORP·Filed 2021·Granted May 23, 2023·0 cites·1 claims
- 4076US9082846B2Integrated circuits with laterally diffused metal oxide semiconductor structuresGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Jul 14, 2015·5 cites·17 claims
- 4176US7323736B2Method to form both high and low-k materials over the same dielectric region, and their application in mixed mode circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted Jan 29, 2008·4 cites·44 claims
- 4276US6835631B1Method to enhance inductor Q factor by forming air gaps below inductorsCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted Dec 28, 2004·26 cites·63 claims
- 4376US6372652B1Method for forming a thin-film, electrically blowable fuse with a reproducible blowing wattageCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Apr 16, 2002·33 cites·16 claims
- 4475US9780207B2Self-aligned high voltage LDMOSGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Oct 3, 2017·2 cites·20 claims
- 4575US2024379492A1Semiconductor structure with heat dissipation structure and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 4674US8802484B1Integration of germanium photo detector in CMOS processingVERMA PURAKH RAJ·Filed 2013·Granted Aug 12, 2014·4 cites·14 claims
- 4774US7951680B2Integrated circuit system employing an elevated drainGLOBALFOUNDRIES SG PTE LTD·Filed 2008·Granted May 31, 2011·5 cites·20 claims
- 4873US12080622B2Semiconductor structure and method of wafer bondingUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 3, 2024·0 cites·20 claims
- 4973US11881529B2Semiconductor device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jan 23, 2024·0 cites·8 claims
- 5073US11114562B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Sep 7, 2021·1 cites·9 claims
Showing the top 50 of 168 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →